Ensure correct-by-construction filler cell insertion in less time, while using standard industry interfaces that seamlessly integrate with both the P&R and physical verification tools.
July 05, 2022 by Siemens Digital Industries Software
Programmable DC power sources are an essential tool in product development and production testing of a wide range of electronic devices and systems. In many instances, functional test requires submitting the device-under-test (DUT) to a wide range of operating conditions. In some cases, the DUT draws constant power under variable input conditions.
March 18, 2022 by EA Elektro-Automatik
This white paper explores the journey of understanding how to meet quality requirements and accelerate time-to-market for your company’s latest flagship high performance computing (HPC) artificial intelligence (AI)-enabled system-on-chip (SoC) design.
March 01, 2022 by Siemens Digital Industries Software
This white paper explains how looking holistically at all elements in the EV power train helps identify opportunities to improve EV and enhance overall power efficiency, leading to a longer EV driving range.
September 21, 2021 by Analog Devices
This paper outlines the multi-dimensional nature of this complexity and the costs and opportunities it generates. It also demonstrates that the key to designers meeting this challenge is the ability to attain system-level visibility: both during the semiconductor development cycle, and subsequently after embedded systems are deployed in the field.
August 30, 2021 by Siemens Digital Industries Software
Programmable DC power sources are an essential tool in product development and production testing of a wide range of electronic devices and systems. In many instances, functional test requires submitting the device-under-test (DUT) to a wide range of operating conditions. In some cases, the DUT draws constant power under variable input conditions.
August 16, 2021 by EA Elektro-Automatik
This white paper describes the basic theory for DC power supply efficiency calculations, presents a physical setup for accurately measuring the important parameters, and provides an example program that coordinates measurements and automatically calculates power supply efficiency quickly.
July 02, 2021 by Siglent
Among the challenges for design-for-test (DFT) engineers is how to set a target metric for automatic test pattern generation (ATPG) and how to choose the best set of patterns. Traditional coverage targets based on the number of faults detected don’t consider the likelihood of one fault occurring compared to another.
June 17, 2021 by Siemens Digital Industries Software
