DDR3 Data Eye Diagram Testing White Paper and T&M Reference Sheet


DDR3 Data Eye Diagram Testing

Compliance testing is essential to ensure that dynamic random access memory (DRAM) signals meet specifications in timing, slew rates, and voltage levels. To quickly check signal qualities, eye diagram testing can provide insights into signal integrity conditions in a much shorter time. This white paper from Rohde & Schwarz details a process for testing DDR interface signal quality with data eye analysis.

Register below to view the white paper and also gain access to a FREE and informative Test and Measurement Equipment reference sheet with everything you need to know about T&M equipment from oscilloscopes to network analyzers, electrical waveforms, and more!


White Paper Highlights

  1. The DDR eye
  2. Mask test and limit
  3. Separating read/write bursts
  4. BONUS: T&M Equipment reference sheet


Register Below to View White Paper