Demystifying Deembedding for Testing High-Speed Digital and RF Signals

This webinar is created for engineers who deal with high-speed digital and RF signal measurements. It will explore the impact of the measurement setup on the results and the methods that can help obtain the real signal of the device under test, something that is required by multiple standards.

Users will be able to learn in great detail about the error sources such as bandwidth limitation, impedance mismatch, coupling and probing effects. The speakers will discuss and use demonstrations to show how you can model and eliminate those errors. Defining system parameters, extracting and importing S parameters and observing the deembedded response are key steps of an easy deembedding process.

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