Latest Computers & Peripherals Technical Articles

Enabling Industrial Network Design with Time-Sensitive Networking

OT (operational technology) and IT (informational technology) may have different real-time needs, but they're merged in the TSN (time-sensitive networking) Ethernet-based standards. Learn about the theory and hardware involved in implementing TSN in industrial network design.

August 12, 2021 by Christian Castel, NXP

How to Protect Low-Speed Interfaces and Power Supply Circuits

In this installation of the "Protect Your Ports! Top Design Tips to Keep Your Communications Connected" series, we'll discuss low-speed interfaces and power supply circuits—including audio/video ports, DC power supplies, and more—as well as various methods of how to protect them.

July 11, 2021 by Todd Phillips

Optimizing Power Management with NXP’s i.MX RT500 Crossover MCU

This article provides an introduction to microcontroller power management concepts. The NXP i.MX RT500 family of crossover MCUs will be used to provide examples of how these power management concepts can be employed by embedded developers in their applications.

July 08, 2021 by Alejandra Guzman, NXP Semiconductors

Design Tips for Protecting High-Speed Interfaces

In this second installment of the "Protect Your Ports! Top Design Tips to Keep Your Communications Connected" series, we explore what protecting high-speed interfaces looks like, including USB, HDMI, DisplayPort, and eSATA.

June 29, 2021 by Todd Phillips

An Introduction to Switched-capacitor Circuits

In this series of articles, we’ll discuss one of the fundamental building blocks of analog IC design: the switched-capacitor circuit.

April 21, 2021 by Jake Hertz

Learn About Three-Op Amp Instrumentation Amplifiers

In this article, we'll discuss instrumentation amplifiers (in-amps) which have high common-mode rejection and provide high and equal input impedances. We will also look at the advantages and disadvantages of a commonly-used in-amp often referred to as the three-op amp in-amp.

March 29, 2021 by Dr. Steve Arar

Understanding the Heterogeneous Graphics Pipeline of i.MX RT1170 MCUs

In this article, learn about the heterogeneous graphics pipeline of the i.MX RT1170 MCU and its three main graphics acceleration engines.

March 18, 2021 by Hugo Osornio, NXP Semiconductors

Common-Mode Rejection: A Key Feature of Instrumentation Amplifiers

In this article, we’ll examine a bridge measurement system to show why an in-amp needs to have a high common-mode rejection to successfully extract a small differential signal.

March 05, 2021 by Dr. Steve Arar

All About Seeing Your Projects: Optical and Digital Magnification

Smaller electronics call for more powerful inspection equipment. If you're building a collection of at-home lab equipment, these visual tools may help you see where you're going on minuscule boards.

February 14, 2021 by Mark Hughes

Nine Factors to Consider for Board-Level Machine Vision Camera Integration

Leveraging board-level cameras offer a variety of benefits. To help identify the right mix of features and design elements, here are some factors to consider when selecting and designing in an embedded machine vision camera.

February 11, 2021 by Brian Cha, FLIR

Understanding Multi-Faceted Modeling Within Fusion 360

Documentation within the project pipeline is essential and design modeling is no different. In this article, learn about how to leverage the different modeling methods in Fusion 360.

November 24, 2020 by Sam Sattel, Autodesk

How the PowerQuad Co-processor Frees Up CPU Cores in the LPC55S69 MCU

In this article, learn about the PowerQuad co-processor and its role in performing CPU-heavy tasks to allow the Arm Cortex-M33 cores to execute other tasks in the LPC55S69 MCU.

November 19, 2020 by Eli Hughes, NXP Semiconductors

Adding an ISP and Machine Learning Acceleration to the i.MX 8M Family

Learn how the i.MX 8M Plus applications processor enables edge computing, speeding up machine learning for a variety of applications including industrial tasks.

November 10, 2020 by Ben Eckermann, NXP Semiconductors

Understanding Electromagnetic Compatibility Tests: Conducted EMC

This article is the first in a two-part series that reviews the basics of electromagnetic compatibility tests. First, we'll focus on a main category of EMC tests—conducted EMC—and the relevant test setup.

October 07, 2020 by Ignacio de Mendizábal

The Effect of MOS Non-Idealities on VLSI Circuit Reliability

Learn about various non-idealities of MOS transistors and the effects they have on VLSI system reliability.

October 06, 2020 by Tosin Jemilehin

Finding Statistical Relationships with Correlation Coefficients

The Pearson and Spearman correlation coefficients are standard techniques for inferring causation by calculating the strength of a linear or monotonic relationship between two variables.

September 30, 2020 by Robert Keim

Overcoming the Challenges of Traditional MCAD and ECAD

MCAD and ECAD have inserted themselves into most design engineers' day-to-day work. Although familiar, both programs have come a long way and are continuing to evolve. In this article, learn the past and future of these design tools.

August 27, 2020 by Sam Sattel, Autodesk