Secure connectivity is becoming one of the most important challenges for IoT applications. This webinar will help you learn how innovative security measures—Intrinsic ID’s patented SRAM PUF technology coupled with Trusted Secure IP from Renesas—can help you quickly and easily create device and board-level authentication to safely secure a connected IoT system.
During this webinar, you’ll learn:
• Why creating a Root of Trust is critical for securing connected embedded systems
• Benefits of SRAM PUF-based secure key provisioning compared to traditional key generation methods
• How to establish foundational security at any stage of the product lifecycle
• How to address today’s anti-counterfeiting challenge
Michael Sarpa, Product Marketing Manager, RX Products & Solutions, Renesas Electronics America
Michael Sarpa is responsible for product marketing and customer development for Renesas’ flagship RX 32-bit MCU product line.RX MCUs are at the heart of all aspects of IoT development from the node to the cloud and Michael’s 25+ years of experience working with and supporting embedded developers provides customers and ecosystem partners an excellent resource when developing next-generation platforms.
Alpesh Saraiya, Senior Director Product Management for Intrinsic ID
Alpesh Saraiya joined Intrinsic ID as Senior Director Product Management in 2017 after serving in senior product roles at some of the world’s top electronics companies. Saraiya ’s experience managing secure, connected products includes leading the webOS Core for LG Electronics’ Smart TVs and other connected IoT applications such as smart home, smart car, wearables and mobile. Prior roles include steering the Genesis Microchip digital TV business to an acquisition exit by STMicroelectronics. He also held senior marketing roles at Broadcom and C-Cube Microsystems, as well as R&D positions at IBM. Saraiya holds a Master of Science degree in Computer Engineering from Syracuse University and a Bachelor of Science degree in Electrical and Computer Engineering from University of Tennessee, Knoxville.