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Designing and Simulating EMC Filters with LTspice

In this article, we will review the different types of noise that are present in a circuit. We will also discuss how to perform an accurate simulation of an EMC filter with LTspice.

22 hours ago by Ignacio de Mendizábal

How to Design a Precision Current Pump with Op-Amps

This article discusses a voltage-controlled current-source circuit that requires only two op-amps and a handful of resistors.

4 days ago by Robert Keim

Finding Statistical Significance from t-Tests Applied to Engineered Systems

This article discusses important aspects of t-testing with the help of the example experiment presented in the previous article.

October 14, 2020 by Robert Keim

Understanding Radiated Electromagnetic Compatibility Tests

This article is the second in a two-part series that reviews the basics of electromagnetic compatibility tests. We'll now turn our attention to radiated EMC tests.

October 13, 2020 by Ignacio de Mendizábal

Points to Consider When Selecting an NTC Thermistor

This article explores NTC thermistor types and their critical performance criteria and provides advice on selecting the appropriate device for a given application.

October 13, 2020 by Krystian Milewski , TDK

Applying the t-Test to Engineered Systems

This article provides an example of how we can use t-testing to determine if an experiment has produced a statistically significant change in system performance.

October 12, 2020 by Robert Keim

The Fundamentals of Power Density

In this article, learn about the power density in power management systems, including how it is estimated, its limitations, and solutions for overcoming those limitations.

October 09, 2020 by Texas Instruments

Understanding t-Values and Testing for Statistical Significance

This article explains how t-values are calculated and used to decide whether experimental data indicate a relationship between variables.

October 08, 2020 by Robert Keim

How to Verify and Validate Designs Using Fusion 360

This article discusses why verification and validation matter in design, how they differ, and how applications help teams incorporate and enrich their workflows.

October 08, 2020 by Sam Sattel, Autodesk

Understanding Electromagnetic Compatibility Tests: Conducted EMC

This article is the first in a two-part series that reviews the basics of electromagnetic compatibility tests. First, we'll focus on a main category of EMC tests—conducted EMC—and the relevant test setup.

October 07, 2020 by Ignacio de Mendizábal

The Effect of MOS Non-Idealities on VLSI Circuit Reliability

Learn about various non-idealities of MOS transistors and the effects they have on VLSI system reliability.

October 06, 2020 by TosinJemilehin

Technology Enablers for Faster, Safer, High-Efficiency EV chargers

This article looks at semiconductor technologies that are driving EV chargers, including high-voltage semiconductor switches, power converters, and multi-level complex power stages.

October 06, 2020 by Jayanth Rangaraju, Texas Instruments

Understanding the t-Distribution in Tests for Statistical Significance

This article introduces a statistical distribution used in significance testing. We’ll discuss its importance and its relation with the normal distribution.

October 05, 2020 by Robert Keim

Statistical Significance in Experimentation and Data Analysis

What exactly do scientists and researchers mean when they state that something is or is not statistically significant? How do we establish statistical significance, and how do we interpret it?

October 02, 2020 by Robert Keim

A Brief Review of the Tools and Parameters of EMC Testing

While most electromagnetic compatibility (EMC) tests are conducted in specialized laboratories, electrical engineers can still benefit from knowing the basics of EMC testing.

October 01, 2020 by Ignacio de Mendizábal

Finding Statistical Relationships with Correlation Coefficients

The Pearson and Spearman correlation coefficients are standard techniques for inferring causation by calculating the strength of a linear or monotonic relationship between two variables.

September 30, 2020 by Robert Keim

Non-Idealities in VLSI Circuits

This article discusses VLSI (very-large-scale integration) circuits and the sources of non-idealities that affect MOS transistors.

September 29, 2020 by TosinJemilehin

How to Reduce Noise in Low-Voltage Amplifier Designs

This article compares the noise performance of two different amplifiers and optimizes noise performance through the use of passive filtering.

September 29, 2020 by Daniel Miller, Texas Instruments

Understanding Contrast, Histograms, and Standard Deviation in Digital Imagery

Statistical techniques can help us to analyze the distribution of light and dark tones in an image.

September 28, 2020 by Robert Keim

Understanding the Six Power Modes for Maximum Efficiency on NXP’s LPC55S69 MCU 

This article explores the power rails and power modes of the LPC55S69 and investigates how the modes affect the MCU in various applications.

September 24, 2020 by Mark Dunnett, on Behalf of NXP