The 12-term error model is a simple, effective way of modeling systematic errors in vector network analyzer (VNA) measurements. Learn about this model and an associated error correction technique in this article.
March 10, 2024 by Dr. Steve Arar
This article explains how to estimate the dynamic range a vector network analyzer (VNA) needs for a given measurement, then discusses four techniques for boosting the dynamic range to the required level.
February 18, 2024 by Dr. Steve Arar
As part of a vector network analyzer (VNA), a directional coupler enables us to characterize a device’s performance by its S-parameters. Read this article to learn more about this important piece of equipment.
January 19, 2024 by Dr. Steve Arar
Histogram testing is the most popular method for determining analog-to-digital converter (ADC) static parameters. In this article, learn the basics of histogram testing and the specifics of how to use a linear ramp histogram test.
October 15, 2023 by Dr. Steve Arar
This article is the first in a two-part series that reviews the basics of electromagnetic compatibility tests. First, we'll focus on a main category of EMC tests—conducted EMC—and the relevant test setup.
October 07, 2020 by Ignacio de Mendizábal