The 12-term error model is a simple, effective way of modeling systematic errors in vector network analyzer (VNA) measurements. Learn about this model and an associated error correction technique in this article.
March 10, 2024 by Dr. Steve Arar
This article explains how to estimate the dynamic range a vector network analyzer (VNA) needs for a given measurement, then discusses four techniques for boosting the dynamic range to the required level.
February 18, 2024 by Dr. Steve Arar
As part of a vector network analyzer (VNA), a directional coupler enables us to characterize a device’s performance by its S-parameters. Read this article to learn more about this important piece of equipment.
January 19, 2024 by Dr. Steve Arar
Histogram testing is the most popular method for determining analog-to-digital converter (ADC) static parameters. In this article, learn the basics of histogram testing and the specifics of how to use a linear ramp histogram test.
October 15, 2023 by Dr. Steve Arar
Servo-loop testing allows the determination of an analog-to-digital converter (ADC) transfer function. This article will describe the basics of servo-loop ADC testing and illustrate several different servo-loop test configurations.
August 20, 2023 by Dr. Steve Arar
The Y-factor method simplifies noise figure measurements by allowing the use of variable attenuators in place of a calibrated power meter. In addition to defining the Y factor, we will discuss noise source uncertainty and fixturing losses that can introduce errors in your noise figure measurements.
August 11, 2023 by Dr. Steve Arar
This article will demonstrate that the AC current density decreases exponentially into a conductor. It will also explain why we can assume that the total current has a uniform distribution from the surface down to one skin depth of the conductor.
August 06, 2023 by Dr. Steve Arar
The Y-factor method is a widely used technique for measuring the gain and noise figure (NF) of RF components. This article will help you understand the differences between the insertion gain and the available gain, while avoiding potentially significant errors when measuring the noise figure.
June 28, 2023 by Dr. Steve Arar
This project demonstrates the design and operation of a root-mean-squared (RMS) detector for inclusion in a wideband voltmeter. The RMS detector is useful for measuring certain signal types, including noise, since it provides an indication of the energy in a signal.
June 25, 2023 by John Woodgate