New Jitter Separation Method for Debugging High-Speed Interfaces With the R&S®RTP Oscilloscope

Overview

Rohde & Schwarz have developed a new method for separate individual jitter components, providing electronic circuit designers with a powerful new tool for debugging and characterization of high-speed signal transmissions. The algorithm is based on a parametric signal model and provides the user with additional details of the jitter characteristic of the device under test.

In this webinar by Rohde and Schwarz, explore the fundamentals of jitter measurements, learn more about R&S oscilloscopes, and gain insight into a new method for separate individual jitter components, providing electronic circuit designers with a powerful new tool for debugging and characterization of high-speed signal transmissions. 

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