All About Circuits
Arthi Krishnamurthy
Arthi Krishnamurthy Segment Manager, EMC Testing, Rohde & Schwarz

ABOUT

Arthi Krishnamurthy is a Market Segment Manager supporting ICR (Industrial, Components & Research) applications at Rohde & Schwarz in Munich, Germany. Since joining Rohde & Schwarz in 2021, Arthi has quickly become the voice of EMC; leading segment planning and providing strategic direction for its core EMC test business.
Vignesh Rajamani
Vignesh Rajamani EMC Strategy & Business Development Manager, Rohde & Schwarz

ABOUT

Dr. Vignesh Rajamani is working as a Manager for EMC Strategy and Business Development for Rohde & Schwarz in North America. Vignesh is an expert in the electromagnetic characterization and application of reverberation chambers. A main thrust of his research and project experience in the area of reverberation chambers has been towards increasing test accuracy.

EMC Reverberation Testing: Valuable Insights for Emissions and Immunity Testing

Watch this webinar to learn how reverberation chambers enhance EMC testing for complex electronics, ensuring compliance with the latest standards and methodologies.


In partnership with Rohde & Schwarz

Tech Talk Overview

In today's world, electronic devices are not just singular entities but intricate ecosystems comprising numerous components, each with its own potential to emit and be affected by electromagnetic interference (EMI). The complexity of modern electronics necessitates meticulous EMC testing to ensure that these components can coexist without causing or experiencing disruptive interference.

In this Tech Talk, we will delve into addressing the specific challenges of EMC testing in highly integrated electronics by testing in reverberation chambers. We explore the benefits of reverb chamber testing as an efficient tool for emissions and immunity testing as well as the latest standards and methodologies.

What you will learn:

  • Differences between testing in reverberation and anechoic chambers
  • Applied test standards
  • Existing methods
  • Developments in the future

Free Webinar Registration

Already an All About Circuits member? Please Click Here to login.
Fields containing * are required