Industry White Paper

Advanced Embedded Systems Debug with Jitter and Real-Time Eye Analysis

June 03, 2024 by RIGOL
Topics Covered
  • Characterizing Jitter
  • Signal Quality & the Eye Diagram

Application Note Overview

Debugging embedded designs is one of the most challenging tasks for electronic engineers. Effective serial data analysis requires more than simple triggering and decoding but historically there has been a significant cost difference between oscilloscopes with mixed signal, serial triggering and decode capabilities, and the high-performance instruments with advanced analysis functionality. Engineers need the ability to test long term signal quality characteristics— including jitter and eye patterns—without investing in top-end performance, high-cost solutions.

This RIGOL application note discusses the use of capabilities such as jitter measurement and real-time eye analysis for faster debug of embedded systems.