Critical Area Based Test Pattern Optimization
White Paper Overview
Among the challenges for design-for-test (DFT) engineers is how to set a target metric for automatic test pattern generation (ATPG) and how to choose the best set of patterns. Traditional coverage targets based on the number of faults detected don’t consider the likelihood of one fault occurring compared to another. Targets need to be adjusted for a new technology node when new important fault models are introduced.
This white paper examines and answers questions such as:
How do companies decide what targets to set for them?
If you want to apply a sample of patterns aimed at a new fault model, which ones should you try?