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Industry White Paper

Enabling Smarter Industrial 3D Sensing with Hyperlux™ ID

Discover how advanced iToF and dToF sensing technologies support industrial automation with accurate depth mapping, reduced motion artifacts, and long-range 3D perception.


May 26, 2026 by onsemi
Topics Covered
Principal Methods of Depth Sensing
Direct Time-of-Flight (dToF)
Indirect Time-of-Flight (iToF)
Hyperlux™ ID CMOS iToF Sensors
Motion Artifact Reduction and Global Shutter Efficiency
Industrial 3D Sensing Applications

Tutorial Overview

As industrial automation systems become more intelligent and autonomous, accurate depth perception is essential for robotics, logistics, access control, and machine vision applications. This tutorial examines the core principles behind modern 3D sensing technologies, including direct and indirect time-of-flight (dToF and iToF), and explains how these methods enable precise real-time depth measurement in industrial environments.

The tutorial also highlights how onsemi’s Hyperlux™ ID sensors address common challenges in industrial depth sensing, including motion artifacts, ambient light interference, limited range, and system complexity. Readers will learn how features such as dual-frequency measurement, global shutter timing optimization, integrated depth processing, and high quantum efficiency support more reliable and accurate 3D sensing performance across a wide range of applications.

Download now to explore the technologies and design considerations shaping the next generation of industrial 3D sensing systems.

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