Topics Covered
- Commonly Used Measurement and Characterization Techniques
- Measuring the High Side Gate Driver
- Measuring the Low Side and Inferring the Result to the High Side
- Measuring Gate Drive Current
White Paper Overview
The better a gate driver is at reducing power-up and power-down times, the higher the challenge for accurate measurements. Both choosing the right probe and optimizing the probing technique are significant factors in improving measurement accuracy. Download this white paper by Rohde & Schwarz as a quick guide.
