Industry White Paper

Net Common Resistance Extraction is Crucial to Design Reliability

White Paper Overview

Accurately extracting and calculating the common resistance of interconnects within analog IC designs is fundamental for evaluating circuit reliability, particularly for noise and voltage drop analysis and ESD protection verification.
Given continuous technology scaling and the corresponding decrease in feature size, and the increase in design applications’ types and complexity, reliability verification is now a critical function of IC design verification and tapeout. Reliability in IC design relates to both physical and operational reliability, either of which can be impacted by the effect of interconnect resistance.

In this white paper you will learn about:

  • Common resistance of a net
  • Noise & voltage drop analysis
  • ESD checks
  • Automated common resistance checking

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