Industry White Paper

System Level Verification and Debug of DDR3/4 Memory Designs

Whitepaper Overview

System designers and test engineers working on DDR memory designs need to know the best practices in the design verification and debugging process.

The paper explains the recommended test points and the connection of oscilloscope probes as well as the compensation of effects from DDR interposers via deembedding. Several key elements of this include efficient Signal Integrity verification with eye diagram measurements, advanced triggering, and TDR/TDT functionality. Given the high number of signal lines and the dynamic bus termination, SSN (simultaneous switching noise) also has a significant effect in DDR memory designs and Signal Integrity as well as Power Integrity is highly pattern dependent.

Readers will also learn techniques to achieve high acquisition rates and help to efficiently detect worst case scenarios, affecting the performance of the overall memory design. 

Finally, this application note from Rohde & Schwarz provides an introduction to the DDR memory technology and explains common challenges, related to the specific nature of DDR data, command / address and control buses and describes the typical measurements to verify and debug DDR system designs.

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