Test and Optimize Your SiC Design to Minimize EMI

White Paper Overview 

Demonstrating that silicon carbide (SiC) has equal or lower noise levels relative to silicon (Si) is a barrier to entry. SiC device and module manufacturers have surveyed their customer base and over 40% consider see EMI-related noise as a primary hindrance to adoption. This white paper discusses EMI challenges associated with migrating a design from Si to SiC, test tools and test methodology, along with mitigation and optimization techniques.