This is a measuring instrument which has pursued not only functionality, but also operability, high accuracy, and stability. The vertical deflection system is provided with the DUAL function. The horizontal deflection system has a sweep time of up to 50ns/div. The CRT has a display area of 8 div. x 10 div. with non-parallax internal graticule. It allows high-luminance waveform observation.
Bandwidth: 40 MHz
Analog Channels: 2
Digital Channels: 0
Max Sample Rate: 0 GS/s
Max Memory Depth: 0 Mpts
Operating System: Embedded
Form Factor: Benchtop
Bandwidth: 20 MHz
Analog Channels: 2
Digital Channels: 0
Max Sample Rate: 0 GS/s
Max Memory Depth: 0 Mpts
Operating System: Embedded
Form Factor: Benchtop
Bandwidth: 30 MHz
Analog Channels: 2
Digital Channels: 0
Max Sample Rate: 0 GS/s
Max Memory Depth: 0 Mpts
Operating System: Embedded
Form Factor: Benchtop