Joe Mallon Joe Mallon has over 25 years of experience working in the RF and Microwave industry on both the commercial wireless as well as the Aerospace and Defense markets. Throughout his career, he has held a variety of positions including Engineering, Sales and Sales Management. Joe has held positions at Motorola, Lockheed Martin, Anaren Microwave, Crane Electronics and Anritsu. In his current position at Rohde & Schwarz he serves as a Business Development Manager for R&S’s line of Vector Network Analyzers. Joe holds a BSEE degree from Drexel University in Philadelphia, Pennsylvania.
Jonas Urbonas Jonas Urbonas received the B.Eng and Ph.D. degrees in Electronic Engineering from the University of Surrey, Guildford, United Kingdom in 2015 and 2019 respectively. He joined Maury Microwave Inc. in 2019 as a senior product engineer where he specializes in the development of new RF & Microwave device characterization solutions and their applications. Dr. Urbonas has published multiple peer-reviewed publications in various IEEE Journals and is a member of the IEEE Microwave Theory and Techniques, Instrumentation and Measurement, Electron Devices, and Solid-State Circuits societies. In 2019, he was awarded The ARFTG Roger Pollard Student Fellowship in Microwave Measurements and won the best paper and best student paper awards at the 91st and 92nd ARFTG Microwave Measurement Conferences respectively.

mmWave & sub-THz Active Load-Pull, Gain Compression, and S Parameter Measurements

In partnership with Rohde & Schwarz

Webinar Overview

Various applications and systems can support mmW and sub-THz spectrum frequencies. Passive devices, such as filters, splitters, and combiners, and active devices, such as LNAs, PAs, mixers, and receivers, can all potentially support these frequencies. 6G applications are likely to use frequencies above 100GHz, even up to 330GHz, in research.

S-parameters are a key component of measuring and analyzing the characteristics of a device over particular frequencies. Critical specifications like the compression of an amplifier or out-of-band rejection of a filter are derived from S-parameters. Linear small signal device models can also be derived from S-parameters for simulation.

In this webinar from Rohde & Schwarz, viewers will learn how to take S-parameter measurements and complex wave quantity measurements with the ZNA Vector Network Analyzer. The ZNA platform has high dynamic range (140 dB Typ - 170 dB achievable) and measurement speeds of 401 pts @ 32.2 ms. It is available from 10 MHz to 26.5/43.5 GHz.

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