Performance-Based Assessments for Semiconductor Circuit Competencies

Use a variable-voltage, regulated power supply to supply any amount of DC voltage below 30 volts. Specify standard resistor values, all between 1 kΩ and 100 kΩ (1k5, 2k2, 2k7, 3k3, 4k7, 5k1, 6k8, 10k, 22k, 33k, 39k 47k, 68k, etc.). Use a sine-wave function generator to supply an audio-frequency input signal, and make sure its amplitude isn’t set so high that the amplifier clips.

An extension of this exercise is to incorporate troubleshooting questions. Whether using this exercise as a performance assessment or simply as a concept-building lab, you might want to follow up your students’ results by asking them to predict the consequences of certain circuit faults.

Use a variable-voltage, regulated power supply to supply any amount of DC voltage below 30 volts. Specify standard resistor values, all between 1 kΩ and 100 kΩ (1k5, 2k2, 2k7, 3k3, 4k7, 5k1, 6k8, 10k, 22k, 33k, 39k 47k, 68k, etc.). Use a sine-wave function generator to supply an audio-frequency input signal, and make sure its amplitude isn’t set so high that the amplifier clips at the specified gain.

An extension of this exercise is to incorporate troubleshooting questions. Whether using this exercise as a performance assessment or simply as a concept-building lab, you might want to follow up your students’ results by asking them to predict the consequences of certain circuit faults.

Use a variable-voltage, regulated power supply to supply any amount of DC voltage below 30 volts. Specify standard resistor values, all between 1 kΩ and 100 kΩ (1k5, 2k2, 2k7, 3k3, 4k7, 5k1, 6k8, 10k, 22k, 33k, 39k 47k, 68k, etc.). Use a sine-wave function generator to supply an audio-frequency input signal, and make sure its amplitude isn’t set so high that the amplifier clips.

An extension of this exercise is to incorporate troubleshooting questions. Whether using this exercise as a performance assessment or simply as a concept-building lab, you might want to follow up your students’ results by asking them to predict the consequences of certain circuit faults.