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Smarter Factories with Edge AI Vision: How ADLINK and NXP Improved Yield and Reliability

Smarter Factories with Edge AI Vision: How ADLINK and NXP Improved Yield and Reliability

Discover how NXP and ADLINK boosted semiconductor yield and enabled predictive maintenance with edge AI vision.


A New Approach to Load Pull

A New Approach to Load Pull

With increasing signal bandwidths, modulated signals are being used more and more in load pull environments. In this paper, we look at use-cases and a new method to run load pull testing with modulated signals.


From Footfall to Foresight: Revolutionizing Retail Analytics with Real-Time Edge AI

From Footfall to Foresight: Revolutionizing Retail Analytics with Real-Time Edge AI

Download the white paper to discover how real-time edge AI is transforming retail analytics with privacy-first, scalable insights.


RF Signal Generation Primer

RF Signal Generation Primer

Learn more about creating and using complex RF signals for emulation, interference, and characterization in RF analog signal generators and vector signal generators.


Automated Compliance Test Solution for High Speed Ethernet Cables

Automated Compliance Test Solution for High Speed Ethernet Cables

Discover a faster, more reliable way to perform high-speed cable compliance testing with an automation suite. Reduce test time, eliminate manual errors, and get precise pass/fail results—engineered for efficiency and accuracy.


Ultimate Guide to Power Supply for Industrial Applications

Ultimate Guide to Power Supply for Industrial Applications

Master power supply selection for industrial test equipment with this expert guide on noise mitigation, EMC compliance, efficiency, and reliability.


The Engineer’s Guide to Aerospace Defects

The Engineer’s Guide to Aerospace Defects

Gain deeper insight into defect detection and design innovation in aerospace. Download The Engineer’s Guide to Aerospace Defects and see how industrial CT scanning can elevate your quality assurance process.


The Engineer’s Guide to Athletic Equipment Defects

The Engineer’s Guide to Athletic Equipment Defects

Discover how industrial CT scanning can transform your inspection process and ensure your products are safe, high-performing, and recall-free. Download The Engineer’s Guide to Athletic Equipment Defects today to get started.


Using Mixed Signal Oscilloscopes to Find and Diagnose Jitter Caused by Power Integrity Problems

Using Mixed Signal Oscilloscopes to Find and Diagnose Jitter Caused by Power Integrity Problems

This guide explores how power integrity issues affect signal jitter and shows how mixed signal oscilloscopes can pinpoint and resolve root causes.


Making Measurements on 3-Phase Motor Drives with an Oscilloscope

Making Measurements on 3-Phase Motor Drives with an Oscilloscope

Learn how to accurately measure 3-phase motor drives using oscilloscopes, covering electrical, mechanical, and PWM waveform analysis techniques.


Technical Overview of 5G Non-Terrestrial Networks

Technical Overview of 5G Non-Terrestrial Networks

Everything you need to know about NTN technology. Learn about the major aspects, procedures and technical challenges of NR-NTN and IoT-NTN.


Poster: Wireless Communications Standards

Poster: Wireless Communications Standards

This poster provides a detailed overview of the cellular, non-cellular, IoT and GNSS specifications including 5G NR, 6G, LTE and Wi-Fi as specified by the International Telecommunication Union (ITU). Get your copy today!


Transforming Machine Learning with Alif MCUs

Transforming Machine Learning with Alif MCUs

Download Alif Semiconductor's free white paper today and discover how Alif MCUs are transforming machine learning at the edge!


A Guide to Accelerating Your Design Timeline With Electromagnetic Analysis

A Guide to Accelerating Your Design Timeline With Electromagnetic Analysis

Discover how to speed up your design process without sacrificing accuracy using advanced electromagnetic analysis techniques.


Accurate Test Fixture Characterization and De-embedding

Accurate Test Fixture Characterization and De-embedding

This application note offers practical guidance on characterizing and de-embedding lead-in and lead-out structures for accurate measurements of non-connectorized devices using vector network analyzers. It also explains how to export S-Parameter files for use with other test equipment, ensuring precise results across various instruments.


Overview of Conducted EMS and EMI Measurements

Overview of Conducted EMS and EMI Measurements

This application note shows how to configure, calibrate and perform conducted EMS (Electro Magnetic Susceptibility) measurements according to IEC / EN 61000-4-6 and EMI (Electro Magnetic Interference) measurements according to CISPR 16-2-1 with the R&S®EMC32 software tool.


Poster: What Test & Measurement Instruments Do You Need to Test Your Device?

Poster: What Test & Measurement Instruments Do You Need to Test Your Device?

This poster provides a concise visual guide to essential test and measurement instruments such as oscilloscopes, spectrum analyzers, power supplies, and signal generators, to help users select the right tools for device testing, signal integrity, and EMI compliance.


Advanced Programmable Power Supply Features Boost Productivity

Advanced Programmable Power Supply Features Boost Productivity

Explore how advanced power supply features can drive smarter testing and greater efficiency—read the white paper now.


Group Delay Measurements with Signal and Spectrum Analyzers

Group Delay Measurements with Signal and Spectrum Analyzers

This application note helps engineers to gain deeper understanding of group delay measurement with spectrum analyzers and signal generators, and how this method simplifies the test setup and improves the measurement speed.


Poster: What T&M Instrument Can Test Your Device?

Poster: What T&M Instrument Can Test Your Device?

Get the test & measurement instrument guide you need! Download this exclusive poster as a PDF for your lab or workplace today.