This paper provides an overview of the key characteristics of ON Semiconductor Gen 1 1200 V SiC MOSFETs and how they can be influenced by the driving conditions. This resource also provides a guideline on the usage of the NCP51705 an isolated gate driver for SiC MOSFETs.
May 07, 2021 by ON Semiconductor
A new metric for SerDes channel and package characterization is emerging. Effective Return Loss (ERL) is replacing the traditional frequency-domain Return Loss (RL) metric as a more effective means of characterizing SerDes channels.
May 04, 2021 by Siemens Digital Industries Software
The monitoring and testing of a DAC signal chain are critical considerations for open-loop applications. Errors in a DAC signal chain, including DAC intrinsic errors that vary depending on the system, can significantly disrupt the customer design-in experience.
March 23, 2021 by Analog Devices
More and more devices are battery powered or need to have low power consumption for other reasons. In order to minimize your electronic device’s power consumption, you need to know the exact current profile. The R&S®NGM200 power supply series provides this information.
March 17, 2021 by Rohde & Schwarz
January 26, 2021 by Rohde & Schwarz
February 01, 2020 by Vicor