This paper outlines the multi-dimensional nature of this complexity and the costs and opportunities it generates. It also demonstrates that the key to designers meeting this challenge is the ability to attain system-level visibility: both during the semiconductor development cycle, and subsequently after embedded systems are deployed in the field.
August 30, 2021 by Siemens Digital Industries Software
Building blocks of modern embedded systems, including processors, SoCs, system DRAM, non-volatile memories, sensors, and connectivity modules, have varied power requirements. On one extreme, a system power management IC (PMIC) integrates all or almost all of the required power rails. On the other hand, individual power rails are implemented using discrete dc/dc and LDOs.
June 22, 2021 by ROHM Semiconductor
Among the challenges for design-for-test (DFT) engineers is how to set a target metric for automatic test pattern generation (ATPG) and how to choose the best set of patterns. Traditional coverage targets based on the number of faults detected don’t consider the likelihood of one fault occurring compared to another.
June 17, 2021 by Siemens Digital Industries Software
This white paper describes a flexible USB4-based IP solution for edge AI accelerators and SoCs. The IP solution can be used with multiple types of hosts by supporting legacy PCIe 4.0, USB4, USB 3.x, and USB 2.0 connections.
May 12, 2021 by Synopsys
Source control systems have become ubiquitous in the IT world but have not become a major component of operational technology (in particular, PLC programming). There is an increasing, popular movement in the industrial controls world to bring modern source control systems to PLC programming.
April 14, 2021 by Copia Automation
Accurately extracting and calculating the common resistance of interconnects within analog IC designs is fundamental for evaluating circuit reliability, particularly for noise and voltage drop analysis and ESD protection verification.
March 30, 2021 by Siemens Digital Industries Software
The monitoring and testing of a DAC signal chain are critical considerations for open-loop applications. Errors in a DAC signal chain, including DAC intrinsic errors that vary depending on the system, can significantly disrupt the customer design-in experience.
March 23, 2021 by Analog Devices
The integration of multiple digital signal processing (DSP) blocks, wideband digital-to-analog converters (DACs), and wideband analog-to-digital converters (ADCs) within a single monolithic chip are enabling the offloading of FPGA resources.
March 23, 2021 by Analog Devices
In an era where security is paramount in many systems, it is intrinsic for users to be able to boot and load software that is guaranteed to be as secure by using a trust-based mechanism.
March 12, 2021 by Concurrent Technologies
Automobiles are increasingly equipped with radar sensors that support drivers in critical situations, helping to reduce the number of accidents. Radar makes it possible to quickly and precisely measure the radial velocity, range, azimuth angle and elevation angle of multiple objects.
March 11, 2021 by Rohde & Schwarz
Whether used for a process control installation or an industrial automation system, an I/O module (or a field junction box) poses a host of unique challenges in a product's life cycle. Product management, for example, faces key decisions on how many channels and which combinations will be necessary for each product.
February 23, 2021 by Analog Devices
Embedded Universal Integrated Circuit Cards(eUICC) have since replaced traditional SIM cards used in the mobile industry. eUICCs can be integrated into anything from mobile devices to car telematics units, machine-to-machine (M2M) devices (e.g., industrial sensors), and consumer devices.
February 18, 2021 by Rohde & Schwarz
