All About Circuits

Latest EDA Tools Industry White Papers

Categories

Increase Hardware Emulation Productivity with Virtual Mode Share

Increase Hardware Emulation Productivity with Virtual Mode Share

Explore the advantages and benefits of Veloce VirtuaLAB emulation, backed up by three test cases.


Veloce Delivers Best of ICE and Virtual Emulation to the SSD Storage Market

Veloce Delivers Best of ICE and Virtual Emulation to the SSD Storage Market

This white paper discusses the changes in storage technology and why SSD design teams need a complementary tool kit using ICE, the Veloce Deterministic ICE App, and VirtuaLAB.


The Veloce Strato Platform: Unique Core Components Create High Value Advantages

The Veloce Strato Platform: Unique Core Components Create High Value Advantages

Explore how the Veloce® Strato emulation platform chip, operating system software, and hardware work together to enhance verification productivity.


Veloce Primo Completes a Full SoC Verification Landscape

Veloce Primo Completes a Full SoC Verification Landscape

This white paper discusses how SoC verification teams can achieve higher capacity than the desktop prototype and reduce the overall cost of ownership of their hardware verification resources even as it helps to accelerate the verification cycle.


SoC Verification and Validation on Day 1

SoC Verification and Validation on Day 1

Explore this unified software-enabled verification and validation environment that breaks the dependencies between hardware design groups and software developers.


Reliability Verification in the Cloud Delivers Significant Runtime Benefits

Reliability Verification in the Cloud Delivers Significant Runtime Benefits

This white paper from Siemens Digital Industries Software demonstrates how running Calibre PERC verification flows on cloud hardware resources to satisfy peak demand usage can increase productivity and expedite turnaround times.


Automated ESD Protection Verification for 2.5D and 3D ICs

Automated ESD Protection Verification for 2.5D and 3D ICs

Take a look at verification challenges and walk through a proven automated ESD verification methodology for 2.5D and 3D ICs.


Automated Post-Processing of DRC Errors Improves Debugging Productivity

Automated Post-Processing of DRC Errors Improves Debugging Productivity

Learn how to quickly and accurately analyze and fix (or waive) a wide range of complex error conditions with automated post-processing DRC debugging flows.


Embedded Analytics: A Platform Approach

Embedded Analytics: A Platform Approach

This paper outlines the multi-dimensional nature of this complexity and the costs and opportunities it generates. It also demonstrates that the key to designers meeting this challenge is the ability to attain system-level visibility: both during the semiconductor development cycle, and subsequently after embedded systems are deployed in the field.


Online DFM Analysis For Better Products and Faster Cloud-Based Tools For Collaboration Between PCB Designers and Manufacturers

Online DFM Analysis For Better Products and Faster Cloud-Based Tools For Collaboration Between PCB Designers and Manufacturers

This white paper describes Siemens' new cloud-based solution and provides use-case examples. Readers will also get a detailed description and testimonial from an early adopter.


Analog/Mixed-Signal Design and Simulation in a Tanner Flow

Analog/Mixed-Signal Design and Simulation in a Tanner Flow

This white paper displays how the Tanner flow simplifies the design and verification process of Analog/Mixed-Signal design. It also describes how the user can verify design functionality, connectivity, and performance at all levels of the design hierarchy and for all integrated circuit (IC) applications.


Accelerating Electrical Systems Design and Analysis

Accelerating Electrical Systems Design and Analysis

This white paper walks through the design and review of a wiring harness for a small tractor using VeSys. Solutions like the one discussed in this resource allow vehicle manufacturers to meet the demands of product complexity and quality while going to market faster than ever.


Improving the Reliability and Performance of RF ICs With Advanced EDA Technology

Improving the Reliability and Performance of RF ICs With Advanced EDA Technology

In this white paper, the reader will learn how the Calibre tools provide enhanced verification and fill optimization that can drastically reduce the number of simulations required. It also discusses how the tools achieve the aforementioned while still ensuring designs will perform reliably in conformance with their design specifications over the lifetime of the products in which they are used. 


Tape Out On Time With On-Demand Signoff DRC in P&R

Tape Out On Time With On-Demand Signoff DRC in P&R

This white paper looks at the challenges of ever-increasingly complex designs packed into each die and explores techniques that can be used to close designs efficiently and deliver them on time.


A Painless Solution for Analog Verification Management

A Painless Solution for Analog Verification Management

This white paper outlines how to simplify the analog management process by rolling all the tasks into a single tool that also enables the visualization of results in spreadsheets.


Reducing IR and EM Issues With Automated Via Insertion

Reducing IR and EM Issues With Automated Via Insertion

This paper shows how manufacturing requirements can be leveraged to perform automated insertion of DRC/LVS-clean vias.


Critical Area Based Test Pattern Optimization

Critical Area Based Test Pattern Optimization

Among the challenges for design-for-test (DFT) engineers is how to set a target metric for automatic test pattern generation (ATPG) and how to choose the best set of patterns. Traditional coverage targets based on the number of faults detected don’t consider the likelihood of one fault occurring compared to another.


Siemens, AMD, and Microsoft Collaborate on EDA In the Cloud

Siemens, AMD, and Microsoft Collaborate on EDA In the Cloud

This white paper demonstrates how using a production 7nm design, AMD achieved a 2.5X speed up in physical verification cycle time.


New Approaches to Physical Verification Closure and Cloud Computing Come to the Rescue In the EUV Era

New Approaches to Physical Verification Closure and Cloud Computing Come to the Rescue In the EUV Era

This white paper takes a look at how to replace inefficient, less precise verification processes with smarter, more accurate, faster, and more efficient functionality that can improve both the bottom line and product quality.


EDA In the Cloud—Now More Than Ever

EDA In the Cloud—Now More Than Ever

This white paper evaluates the necessity and value of EDA in the cloud while providing a cost-benefit breakdown. Additionally, explore how companies can establish guidelines to ensure that usage is as efficient and cost-effective as possible.