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Four Considerations For High-Speed Digital Design Success

Four Considerations For High-Speed Digital Design Success

This eBook covers an approach that allows for the design of a myriad of interface standards without increasing design and verification time.


Reliability Verification in the Cloud Delivers Significant Runtime Benefits

Reliability Verification in the Cloud Delivers Significant Runtime Benefits

This white paper from Siemens Digital Industries Software demonstrates how running Calibre PERC verification flows on cloud hardware resources to satisfy peak demand usage can increase productivity and expedite turnaround times.


Automated ESD Protection Verification for 2.5D and 3D ICs

Automated ESD Protection Verification for 2.5D and 3D ICs

Take a look at verification challenges and walk through a proven automated ESD verification methodology for 2.5D and 3D ICs.


Automated Post-Processing of DRC Errors Improves Debugging Productivity

Automated Post-Processing of DRC Errors Improves Debugging Productivity

Learn how to quickly and accurately analyze and fix (or waive) a wide range of complex error conditions with automated post-processing DRC debugging flows.


Improving the Reliability and Performance of RF ICs With Advanced EDA Technology

Improving the Reliability and Performance of RF ICs With Advanced EDA Technology

In this white paper, the reader will learn how the Calibre tools provide enhanced verification and fill optimization that can drastically reduce the number of simulations required. It also discusses how the tools achieve the aforementioned while still ensuring designs will perform reliably in conformance with their design specifications over the lifetime of the products in which they are used. 


Tape Out On Time With On-Demand Signoff DRC in P&R

Tape Out On Time With On-Demand Signoff DRC in P&R

This white paper looks at the challenges of ever-increasingly complex designs packed into each die and explores techniques that can be used to close designs efficiently and deliver them on time.


Reducing IR and EM Issues With Automated Via Insertion

Reducing IR and EM Issues With Automated Via Insertion

This paper shows how manufacturing requirements can be leveraged to perform automated insertion of DRC/LVS-clean vias.


Critical Area Based Test Pattern Optimization

Critical Area Based Test Pattern Optimization

Among the challenges for design-for-test (DFT) engineers is how to set a target metric for automatic test pattern generation (ATPG) and how to choose the best set of patterns. Traditional coverage targets based on the number of faults detected don’t consider the likelihood of one fault occurring compared to another.


Streaming Scan Network: A No-Compromise Approach to DFT

Streaming Scan Network: A No-Compromise Approach to DFT

This white paper describes the basic components of the Tessent Streaming Scan Network (SSN), a technology designed to decouple core level and chip level DFT requirements. With SSN, DFT engineers can for the first time implement DFT using a true, effective bottom-up flow, not having to make trade-offs between implementation effort and manufacturing test cost.


Siemens, AMD, and Microsoft Collaborate on EDA In the Cloud

Siemens, AMD, and Microsoft Collaborate on EDA In the Cloud

This white paper demonstrates how using a production 7nm design, AMD achieved a 2.5X speed up in physical verification cycle time.


EDA In the Cloud—Now More Than Ever

EDA In the Cloud—Now More Than Ever

This white paper evaluates the necessity and value of EDA in the cloud while providing a cost-benefit breakdown. Additionally, explore how companies can establish guidelines to ensure that usage is as efficient and cost-effective as possible.


Mitigating Risks in Automotive IP and SoC with Safety Mechanisms

Mitigating Risks in Automotive IP and SoC with Safety Mechanisms

This white paper discusses faults and detectability by a safety mechanism, safety mechanism types and attributes, and how safety mechanism effectiveness is evaluated.


Rethinking Applications Processing for Ultra-Low Power - i.MX 7ULP

Rethinking Applications Processing for Ultra-Low Power - i.MX 7ULP

This white paper discusses how NXP was able to reduce power without severely compromising features and performance dramatically. It also provides a closer look at how the i.MX 7ULP applications processor brings the benefits of a rich OS to battery-powered devices.


Flexible USB4-based Interface IP Solution for AI at the Edge

Flexible USB4-based Interface IP Solution for AI at the Edge

This white paper describes a flexible USB4-based IP solution for edge AI accelerators and SoCs. The IP solution can be used with multiple types of hosts by supporting legacy PCIe 4.0, USB4, USB 3.x, and USB 2.0 connections.


Mentor, AMD, and Microsoft Collaborate on EDA in the Cloud

Mentor, AMD, and Microsoft Collaborate on EDA in the Cloud

Moving some or all of your electronic design automation (EDA) computing to the cloud enables your company to reduce time-to-market and innovate faster, simply by taking advantage of flexible resources and economies of scale.


Spartan-7 SP701 FPGA Evaluation Kit Demonstration Project

Spartan-7 SP701 FPGA Evaluation Kit Demonstration Project

Developing cost-effective industrial image processing systems requires high-performance cameras and flexible image-processing systems capable of adaption.


Source Control, Git, and Industrial Automation

Source Control, Git, and Industrial Automation

Source control systems have become ubiquitous in the IT world but have not become a major component of operational technology (in particular, PLC programming). There is an increasing, popular movement in the industrial controls world to bring modern source control systems to PLC programming.


Jitter Budgeting for Clock Distribution Networks in High-Speed PHYs and SerDes

Jitter Budgeting for Clock Distribution Networks in High-Speed PHYs and SerDes

High speed PHYs, such as industry’s recent DDR5/LPDDR5 operating at 6400 Mbps and high-speed SerDes, heavily rely on on-die clock distribution networks for clock and data transmission.


Addressing the Evolving Technology Needs of Cloud Data Centers with IP

Addressing the Evolving Technology Needs of Cloud Data Centers with IP

The advent of cloud computing nearly 20 years ago has led to a steady migration of computational resources from corporate data centers to the cloud.


Accelerate Time to Market with Calibre nmLVS Recon Technology: A New Paradigm for Circuit Verification

Accelerate Time to Market with Calibre nmLVS Recon Technology: A New Paradigm for Circuit Verification

One thing is clear — tapeouts are getting harder and taking longer. According to statistics from industry conference surveys, at least 50% of scheduled tapeouts slip each year.