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Spartan-7 SP701 FPGA Evaluation Kit Demonstration Project

Spartan-7 SP701 FPGA Evaluation Kit Demonstration Project

Developing cost-effective industrial image processing systems requires high-performance cameras and flexible image-processing systems capable of adaption.


Source Control, Git, and Industrial Automation

Source Control, Git, and Industrial Automation

Source control systems have become ubiquitous in the IT world but have not become a major component of operational technology (in particular, PLC programming). There is an increasing, popular movement in the industrial controls world to bring modern source control systems to PLC programming.


Jitter Budgeting for Clock Distribution Networks in High-Speed PHYs and SerDes

Jitter Budgeting for Clock Distribution Networks in High-Speed PHYs and SerDes

High speed PHYs, such as industry’s recent DDR5/LPDDR5 operating at 6400 Mbps and high-speed SerDes, heavily rely on on-die clock distribution networks for clock and data transmission.


Addressing the Evolving Technology Needs of Cloud Data Centers with IP

Addressing the Evolving Technology Needs of Cloud Data Centers with IP

The advent of cloud computing nearly 20 years ago has led to a steady migration of computational resources from corporate data centers to the cloud.


Accelerate Time to Market with Calibre nmLVS Recon Technology: A New Paradigm for Circuit Verification

Accelerate Time to Market with Calibre nmLVS Recon Technology: A New Paradigm for Circuit Verification

One thing is clear — tapeouts are getting harder and taking longer. According to statistics from industry conference surveys, at least 50% of scheduled tapeouts slip each year.


Net Common Resistance Extraction is Crucial to Design Reliability

Net Common Resistance Extraction is Crucial to Design Reliability

Accurately extracting and calculating the common resistance of interconnects within analog IC designs is fundamental for evaluating circuit reliability, particularly for noise and voltage drop analysis and ESD protection verification.


Optimizing the Integration of DFM and P&R

Optimizing the Integration of DFM and P&R

Design companies and foundries are constantly modifying their design implementation flow to deliver the best possible solution for their operational needs and the best possible designs for the market.


Improving Productivity With More Efficient LVS Debug

Improving Productivity With More Efficient LVS Debug

Layout versus schematic (LVS) verification is an essential and integral part of integrated circuit (IC) verification in a system-on-chip (SoC) design cycle, but with today’s highly dense and hierarchical layouts, increasing circuit complexity, and intricate foundry rules, running LVS can be a time-consuming and resource-intensive endeavor.


How to Successfully Calibrate an Open-Loop DAC Signal Chain

How to Successfully Calibrate an Open-Loop DAC Signal Chain

The monitoring and testing of a DAC signal chain are critical considerations for open-loop applications. Errors in a DAC signal chain, including DAC intrinsic errors that vary depending on the system, can significantly disrupt the customer design-in experience.


Power-Up Phase Determinism Using Multichip Synchronization Features in Integrated Wideband DACs and ADCs

Power-Up Phase Determinism Using Multichip Synchronization Features in Integrated Wideband DACs and ADCs

The integration of multiple digital signal processing (DSP) blocks, wideband digital-to-analog converters (DACs), and wideband analog-to-digital converters (ADCs) within a single monolithic chip are enabling the offloading of FPGA resources.


Power-Up Phase Determinism Using Multichip Synchronization Features in Integrated Wideband DACs and ADCs

Power-Up Phase Determinism Using Multichip Synchronization Features in Integrated Wideband DACs and ADCs

Teleoperation: Remote Operation of Connected & Autonomous Vehicles

Teleoperation: Remote Operation of Connected & Autonomous Vehicles

Advanced Electrical Rule Checking in IC Reliability Verification

Advanced Electrical Rule Checking in IC Reliability Verification

Best Practices for Achieving Accurate Power Integrity Measurements

Best Practices for Achieving Accurate Power Integrity Measurements

Power Integrity Measurements With R&S®RTP Oscilloscopes

Power Integrity Measurements With R&S®RTP Oscilloscopes

Peak Current of Isolated Gate Drivers

Peak Current of Isolated Gate Drivers

Understanding the Basics: A Technology Guide for Component Buyers

Understanding the Basics: A Technology Guide for Component Buyers

CMOS: Toolkit for Digital, Analog, and Imaging Applications

CMOS: Toolkit for Digital, Analog, and Imaging Applications

Solve Tough Challenges with the Right Products

Solve Tough Challenges with the Right Products

Designing a system-on-chip (SoC) with an Arm Cortex-M processor

Designing a system-on-chip (SoC) with an Arm Cortex-M processor