Accurately extracting and calculating the common resistance of interconnects within analog IC designs is fundamental for evaluating circuit reliability,…
Accurately extracting and calculating the common resistance of interconnects within analog IC designs is fundamental for evaluating circuit reliability, particularly for noise and voltage drop analysis and ESD protection verification.
Design companies and foundries are constantly modifying their design implementation flow to deliver the best possible…
Design companies and foundries are constantly modifying their design implementation flow to deliver the best possible solution for their operational needs and the best possible designs for the market.
Layout versus schematic (LVS) verification is an essential and integral part of integrated circuit (IC) verification in a…
Layout versus schematic (LVS) verification is an essential and integral part of integrated circuit (IC) verification in a system-on-chip (SoC) design cycle, but with today’s highly dense and hierarchical layouts, increasing circuit complexity, and intricate foundry rules, running LVS can be a time-consuming and resource-intensive endeavor.
The monitoring and testing of a DAC signal chain are critical considerations for open-loop applications. Errors in a DAC…
The monitoring and testing of a DAC signal chain are critical considerations for open-loop applications. Errors in a DAC signal chain, including DAC intrinsic errors that vary depending on the system, can significantly disrupt the customer design-in experience.
The integration of multiple digital signal processing (DSP) blocks, wideband digital-to-analog converters (DACs), and…
The integration of multiple digital signal processing (DSP) blocks, wideband digital-to-analog converters (DACs), and wideband analog-to-digital converters (ADCs) within a single monolithic chip are enabling the offloading of FPGA resources.
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