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Evolving Healthcare Regulations Force Embedded Technology Change

Evolving Healthcare Regulations Force Embedded Technology Change

Download this white paper to learn how to simplify product development and increase security with modern platforms.


High Dynamic Range Imaging Using Intelligent Linearization in eHDR Technology

High Dynamic Range Imaging Using Intelligent Linearization in eHDR Technology

Need to improve harsh imaging conditions for security and surveillance cameras? Download this white paper to learn how high dynamic range and intelligent linearization can help.


Scaling analog design power integrity analysis is critical to market success

Scaling analog design power integrity analysis is critical to market success

NEW tech paper - automated scalable power integrity analysis tool for analog designs


Veloce ProFPGA Increases Design Efficiency and Brings SoCs to Market Faster

Veloce ProFPGA Increases Design Efficiency and Brings SoCs to Market Faster

In this white paper, the Siemens EDA tool provides a modular, scalable desktop prototyping platform for early software development.


Crafting the Next Generation of Vehicles and Mobility Experiences with Automotive Electronics

Crafting the Next Generation of Vehicles and Mobility Experiences with Automotive Electronics

MaaS is driving the need to add and improve features that support the heart of this new technology. This white paper explores how electronics and sensors are powering today's connected vehicles.


Veloce prototyping solutions accelerate verification of HPC AI-enabled SoCs

Veloce prototyping solutions accelerate verification of HPC AI-enabled SoCs

This white paper explores the journey of understanding how to meet quality requirements and accelerate time-to-market for your company’s latest flagship high performance computing (HPC) artificial intelligence (AI)-enabled system-on-chip (SoC) design.


Beamforming: Fundamentals to Implementation

Beamforming: Fundamentals to Implementation

Learn the fundamentals of beamforming theory for phased array systems and its implementation in Xilinx Zynq® UltraScale+™ RFSoC.


Smarter Products Need Smarter Development

Smarter Products Need Smarter Development

Learn how to increase innovation and drive growth by modernizing digital product delivery.


5G SoCs Demand New Verification Approaches

5G SoCs Demand New Verification Approaches

Learn how to create a new verification flow that combines emulation and X STEP, a platform that can generate, capture, and analyze bit-accurate fronthaul traffic.


End-to-End Vehicle Verification

End-to-End Vehicle Verification

This paper describes how a PreScan, Veloce, and AMEsim tool flow provides the thoroughness of verification to get new cars on the road quickly, efficiently, and safely.


Increase Hardware Emulation Productivity with Virtual Mode Share

Increase Hardware Emulation Productivity with Virtual Mode Share

Explore the advantages and benefits of Veloce VirtuaLAB emulation, backed up by three test cases.


The Veloce Strato Platform: Unique Core Components Create High Value Advantages

The Veloce Strato Platform: Unique Core Components Create High Value Advantages

Explore how the Veloce® Strato emulation platform chip, operating system software, and hardware work together to enhance verification productivity.


Veloce Primo Completes a Full SoC Verification Landscape

Veloce Primo Completes a Full SoC Verification Landscape

This white paper discusses how SoC verification teams can achieve higher capacity than the desktop prototype and reduce the overall cost of ownership of their hardware verification resources even as it helps to accelerate the verification cycle.


SoC Verification and Validation on Day 1

SoC Verification and Validation on Day 1

Explore this unified software-enabled verification and validation environment that breaks the dependencies between hardware design groups and software developers.


Automated ESD Protection Verification for 2.5D and 3D ICs

Automated ESD Protection Verification for 2.5D and 3D ICs

Take a look at verification challenges and walk through a proven automated ESD verification methodology for 2.5D and 3D ICs.


Automated Post-Processing of DRC Errors Improves Debugging Productivity

Automated Post-Processing of DRC Errors Improves Debugging Productivity

Learn how to quickly and accurately analyze and fix (or waive) a wide range of complex error conditions with automated post-processing DRC debugging flows.


Multicore System Management FAQs

Multicore System Management FAQs

This white paper addresses the most frequently asked questions developers have when choosing how to control and manage a multicore system.


Embedded Analytics: A Platform Approach

Embedded Analytics: A Platform Approach

This paper outlines the multi-dimensional nature of this complexity and the costs and opportunities it generates. It also demonstrates that the key to designers meeting this challenge is the ability to attain system-level visibility: both during the semiconductor development cycle, and subsequently after embedded systems are deployed in the field.


Critical Area Based Test Pattern Optimization

Critical Area Based Test Pattern Optimization

Among the challenges for design-for-test (DFT) engineers is how to set a target metric for automatic test pattern generation (ATPG) and how to choose the best set of patterns. Traditional coverage targets based on the number of faults detected don’t consider the likelihood of one fault occurring compared to another.


Streaming Scan Network: A No-Compromise Approach to DFT

Streaming Scan Network: A No-Compromise Approach to DFT

This white paper describes the basic components of the Tessent Streaming Scan Network (SSN), a technology designed to decouple core level and chip level DFT requirements. With SSN, DFT engineers can for the first time implement DFT using a true, effective bottom-up flow, not having to make trade-offs between implementation effort and manufacturing test cost.