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High-Side SmartFETs with Analog Current Sense

High-Side SmartFETs with Analog Current Sense

This application note describes the structure and design philosophy of onsemi High-Side SmartFETs, and provides specific examples and numerical calculations of how to apply SmartFETs with analog current sense into your system to achieve the optimal switching performance.


How to Design a Programmable Gain Instrumentation Amplifier for Precision Wide Bandwidth Signal Chains

How to Design a Programmable Gain Instrumentation Amplifier for Precision Wide Bandwidth Signal Chains

Design wide bandwidth programmable gain instrumentation amplifiers (PGIAs).


Power Electronics Design and Testing | Poster

Power Electronics Design and Testing | Poster

Get an overview and quick guidance on usual converter types, critical measurements and general requirements on all things power electronics design and testing.


Positioning in 5G NR: A Look at the Technology and Related Test Aspects

Positioning in 5G NR: A Look at the Technology and Related Test Aspects

Explore this detailed description of test and measurement methodologies, setups and test procedures, and challenges for 5G NR.


Wireless Control of the R&S®Scope Rider for Increased Operator Safety

Wireless Control of the R&S®Scope Rider for Increased Operator Safety

Learn more about the R&S®ScopeRider, a handheld oscilloscope with a wireless interface for extensive, high-performance remote access.


Gate Drive Measurement Considerations

Gate Drive Measurement Considerations

This white paper provides guidelines for choosing the right probe and optimizing the probing technique for gate driver measurement.


Using Physical and Scalable Simulation Models to Evaluate Parameters and Application Results

Using Physical and Scalable Simulation Models to Evaluate Parameters and Application Results

Learn how physical and scalable models can help a designer analyze components characteristics and optimize application performances.


Debugging Conducted Emissions with Oscilloscopes Made Easy

Debugging Conducted Emissions with Oscilloscopes Made Easy

Learn how to transform oscilloscopes into powerful EMI measurement tools to save time and make it more likely that EMI compliance can be achieved without having to be redesigned.


Know Your Jitter When Debugging

Know Your Jitter When Debugging

This white paper is designed to provide you with a toolbox on how to look for, assess, and address jitter in your signal verification tasks. You will find real-world scenarios, recommended test and measurement solutions and more – all in a bite-sized format.


Advanced Probing in DDR3/DDR4 Memory Design eGuide

Advanced Probing in DDR3/DDR4 Memory Design eGuide

Download this eGuide to receive step-by-step instructions for selecting the right probe and using advanced techniques to improve overall measurement accuracy.


NewSpace Gateway and User Terminal Testing Challenges

NewSpace Gateway and User Terminal Testing Challenges

Learn more about the challenges ground terminals present to design verification testing and manufacturing.


Optimizing Power Efficiency and Performance for Hybrid and Electric Vehicles

Optimizing Power Efficiency and Performance for Hybrid and Electric Vehicles

Explore onsemi’s complete VE-Trac traction inverter portfolio in both SiC and IGBT modules and choose the optimal solution that delivers the highest efficiency and peak power for the next generation of electric vehicles.


Optimizing EMI Input Filters for Switched Mode Power Supplies

Optimizing EMI Input Filters for Switched Mode Power Supplies

Explore methods for separating common-mode and differential-mode noise using two oscilloscope channels without the need for any additional hardware.


Understanding Power MOSFET Avalanche Operation and Associated UIS (UIL) Data Sheet Ratings

Understanding Power MOSFET Avalanche Operation and Associated UIS (UIL) Data Sheet Ratings

Learn more about a specific avalanche power function that forms the basis of avalanche ratings found on power MOSFET data sheets.


Design with EMI in Mind: Test Early, Test Often

Design with EMI in Mind: Test Early, Test Often

Download this poster to help design with EMI in mind.


Test and Optimize Your SiC Design to Minimize EMI

Test and Optimize Your SiC Design to Minimize EMI

Explore EMI challenges associated with migrating a design from Si to SiC, test tools and test methodology, along with mitigation and optimization techniques.


Microchip SiC Power Solutions Guide

Microchip SiC Power Solutions Guide

Using this comprehensive guide, engineers will feel confident to switch to Silicon Carbide (SiC). They can leverage SiC's low switching losses, improved system efficiency, high power density in a smaller footprint, 3x superiority to silicon in thermal conduction, and many other benefits. Download your copy here!


EMC Standards - Overview 5.0

EMC Standards - Overview 5.0

The number of EMC standards published is steadily increasing. In this white paper by Rohde & Schwarz, explore basic standards, generic standards, and product/product family standards.


Over-the-Air RF Conformance Measurements on 5G NR Devices

Over-the-Air RF Conformance Measurements on 5G NR Devices

Learn more about the technical background for over-the-air (OTA) testing on 5G NR devices.


Power Consumption Analysis Tool

Power Consumption Analysis Tool

The power consumption analysis tool was developed to make it easier for customers to analyze power consumption data collected with either the NGL, NGM or NGU power supplies from Rohde & Schwarz. This application note explores the prerequisites needed, interfaces, settings, order information, and more.