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Leveraging 3D Layout to Optimize PCB System Designs

Leveraging 3D Layout to Optimize PCB System Designs

Some engineers believe that the 2D design is no longer sufficient for today’s complicated PCB layouts. Flex and rigid-flex designs, and an increasing need for collaboration with MCAD, require advanced 3D layout design capabilities to address today’s challenges fully.


Effective Return Loss: A New Metric for SerDes Channel or Package Characterization

Effective Return Loss: A New Metric for SerDes Channel or Package Characterization

A new metric for SerDes channel and package characterization is emerging. Effective Return Loss (ERL) is replacing the traditional frequency-domain Return Loss (RL) metric as a more effective means of characterizing SerDes channels.


Xilinx Healthcare Solutions Selector Guide

Xilinx Healthcare Solutions Selector Guide

Identifying the right medical solutions for imaging, diagnostics, and clinical equipment is not easy. The growing needs of scalable healthcare platforms with heterogeneous multi-processing, I/O flexibility, hardware-based deterministic controls, and comprehensive solutions in healthcare artificial intelligence (AI), medical imaging, and safety & security add quite a bit of complexity to the decision process.


Accelerate Time to Market with Calibre nmLVS Recon Technology: A New Paradigm for Circuit Verification

Accelerate Time to Market with Calibre nmLVS Recon Technology: A New Paradigm for Circuit Verification

One thing is clear — tapeouts are getting harder and taking longer. According to statistics from industry conference surveys, at least 50% of scheduled tapeouts slip each year.


Net Common Resistance Extraction is Crucial to Design Reliability

Net Common Resistance Extraction is Crucial to Design Reliability

Accurately extracting and calculating the common resistance of interconnects within analog IC designs is fundamental for evaluating circuit reliability, particularly for noise and voltage drop analysis and ESD protection verification.


Improving Productivity With More Efficient LVS Debug

Improving Productivity With More Efficient LVS Debug

Layout versus schematic (LVS) verification is an essential and integral part of integrated circuit (IC) verification in a system-on-chip (SoC) design cycle, but with today’s highly dense and hierarchical layouts, increasing circuit complexity, and intricate foundry rules, running LVS can be a time-consuming and resource-intensive endeavor.


How to Successfully Calibrate an Open-Loop DAC Signal Chain

How to Successfully Calibrate an Open-Loop DAC Signal Chain

The monitoring and testing of a DAC signal chain are critical considerations for open-loop applications. Errors in a DAC signal chain, including DAC intrinsic errors that vary depending on the system, can significantly disrupt the customer design-in experience.


How Software Configurable Hardware Helps Flexibility in Industrial I/O Modules

How Software Configurable Hardware Helps Flexibility in Industrial I/O Modules

Whether used for a process control installation or an industrial automation system, an I/O module (or a field junction box) poses a host of unique challenges in a product's life cycle. Product management, for example, faces key decisions on how many channels and which combinations will be necessary for each product.


Power-Up Phase Determinism Using Multichip Synchronization Features in Integrated Wideband DACs and ADCs

Power-Up Phase Determinism Using Multichip Synchronization Features in Integrated Wideband DACs and ADCs

μModule Data Acquisition Solution Eases Engineering Challenges for a Diverse Set of Precision Applications

μModule Data Acquisition Solution Eases Engineering Challenges for a Diverse Set of Precision Applications

The electronic industry’s dynamics are rapidly evolving, and there is less time to build and prototype analog circuits to verify their functionality as the control of research and development (R&D) budgets and time to market (TTM) have become more challenging.


Teleoperation: Remote Operation of Connected & Autonomous Vehicles

Teleoperation: Remote Operation of Connected & Autonomous Vehicles

New Approaches to Physical Verification and Cloud Computing

New Approaches to Physical Verification and Cloud Computing

A Machine Learning Approach to CMP Modeling

A Machine Learning Approach to CMP Modeling

Advanced Electrical Rule Checking in IC Reliability Verification

Advanced Electrical Rule Checking in IC Reliability Verification

Enhancing Conversion Efficiency in Power Management ICs

Enhancing Conversion Efficiency in Power Management ICs

Field Programmable Gate Arrays: A Fresh Look at a Classic Embedded Design Tool

Field Programmable Gate Arrays: A Fresh Look at a Classic Embedded Design Tool

Peak Current of Isolated Gate Drivers

Peak Current of Isolated Gate Drivers

Interconnect inductance extraction for analog and RF IC designs

Interconnect inductance extraction for analog and RF IC designs

Getting Started With Critical Area Analysis

Getting Started With Critical Area Analysis

Solve Tough Challenges with the Right Products

Solve Tough Challenges with the Right Products