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Crafting the Next Generation of Vehicles and Mobility Experiences with Automotive Electronics

Crafting the Next Generation of Vehicles and Mobility Experiences with Automotive Electronics

MaaS is driving the need to add and improve features that support the heart of this new technology. This white paper explores how electronics and sensors are powering today's connected vehicles.


Veloce prototyping solutions accelerate verification of HPC AI-enabled SoCs

Veloce prototyping solutions accelerate verification of HPC AI-enabled SoCs

This white paper explores the journey of understanding how to meet quality requirements and accelerate time-to-market for your company’s latest flagship high performance computing (HPC) artificial intelligence (AI)-enabled system-on-chip (SoC) design.


What You Need to Know About EMC Losses

What You Need to Know About EMC Losses

EMC, or electromagnetic compatibility, is a critical part of developing electronic devices to make sure they will perform properly and meet standards. An important part of EMC is understanding the losses that occur and knowing how to calculate and control them – all of which we will explain in this article.


Four Functions That Enhance Your Network Analysis

Four Functions That Enhance Your Network Analysis

A network analyzer that performs multiple accurate measurements on a single connection saves time and simplifies your processes. Advanced network analyzer capabilities and options can help you stay ahead of the curve characterizing modern devices.


The History and Future of Wi-Fi

The History and Future of Wi-Fi

The next generation of all kinds of devices will rely heavily on new iterations of Wi-Fi technology, which will be more powerful, efficient, and complex than ever before. These developments and advancements will enable more connected homes, offices, and factories.


Improving T/R Module Test Accuracy and Throughput

Improving T/R Module Test Accuracy and Throughput

Phased arrays have been used in radar applications for many decades. Recent trends are driving their adoption into other applications such as electronic warfare (EW), satellite systems and even 5G communications.


EMI Debugging with Oscilloscopes

EMI Debugging with Oscilloscopes

A simple guideline to help hardware developers analyze EMI problems using near-field probes in conjunction with digital oscilloscopes.


A Painless Solution for Analog Verification Management

A Painless Solution for Analog Verification Management

This white paper outlines how to simplify the analog management process by rolling all the tasks into a single tool that also enables the visualization of results in spreadsheets.


IoT Regulatory Compliance

IoT Regulatory Compliance

Discover deep insights into regulatory compliance tests, why it is important, its test challenges, and the solutions to overcome these obstacles.


Reducing IR and EM Issues With Automated Via Insertion

Reducing IR and EM Issues With Automated Via Insertion

This paper shows how manufacturing requirements can be leveraged to perform automated insertion of DRC/LVS-clean vias.


5G Voice Over New Radio (VoNR)

5G Voice Over New Radio (VoNR)

In-depth guidance for navigating 5G VoNR in terms of the network deployment and connectivity options to support voice over NR and enable the relevant VoNR data services.


Streaming Scan Network: A No-Compromise Approach to DFT

Streaming Scan Network: A No-Compromise Approach to DFT

This white paper describes the basic components of the Tessent Streaming Scan Network (SSN), a technology designed to decouple core level and chip level DFT requirements. With SSN, DFT engineers can for the first time implement DFT using a true, effective bottom-up flow, not having to make trade-offs between implementation effort and manufacturing test cost.


5G: Managing Component-Level Risks for Commercial Success

5G: Managing Component-Level Risks for Commercial Success

Explore the present state of 5G, use cases in each market, and component-level risks during the development of 5G networks.


Computer-on-Module for High Performance Computing

Computer-on-Module for High Performance Computing

Learn how the long-established COM Express standard for Computer-on-Modules (COM) has been combined with a new high-performance computing standard.


Addressing the Evolving Technology Needs of Cloud Data Centers with IP

Addressing the Evolving Technology Needs of Cloud Data Centers with IP

The advent of cloud computing nearly 20 years ago has led to a steady migration of computational resources from corporate data centers to the cloud.


Accelerate Time to Market with Calibre nmLVS Recon Technology: A New Paradigm for Circuit Verification

Accelerate Time to Market with Calibre nmLVS Recon Technology: A New Paradigm for Circuit Verification

One thing is clear — tapeouts are getting harder and taking longer. According to statistics from industry conference surveys, at least 50% of scheduled tapeouts slip each year.


Net Common Resistance Extraction is Crucial to Design Reliability

Net Common Resistance Extraction is Crucial to Design Reliability

Accurately extracting and calculating the common resistance of interconnects within analog IC designs is fundamental for evaluating circuit reliability, particularly for noise and voltage drop analysis and ESD protection verification.


Optimizing the Integration of DFM and P&R

Optimizing the Integration of DFM and P&R

Design companies and foundries are constantly modifying their design implementation flow to deliver the best possible solution for their operational needs and the best possible designs for the market.


Real-Time Filter Tuning Flow

Real-Time Filter Tuning Flow

Tuning microwave filters requires specialized technicians, which can be very expensive and time-consuming. Using a tool that enables non-specialized technicians to perform this task could be the key to accelerating design and manufacturing processes while still maintaining high-quality performance.


Accelerate Early Design Exploration and Verification for Faster Time to Market

Accelerate Early Design Exploration and Verification for Faster Time to Market

Early chip-level physical verification faces many challenges. The Calibre™ Recon tool enables design teams to perform analysis and physical verification of full-chip design layouts during the very early stages of the design cycle, while the different components are still immature.