This white paper discusses how SoC verification teams can achieve higher capacity than the desktop prototype and reduce the overall cost of ownership of their…
This white paper discusses how SoC verification teams can achieve higher capacity than the desktop prototype and reduce the overall cost of ownership of their hardware verification resources even as it helps to accelerate the verification cycle.
This paper outlines the multi-dimensional nature of this complexity and the costs and opportunities it generates. It also…
This paper outlines the multi-dimensional nature of this complexity and the costs and opportunities it generates. It also demonstrates that the key to designers meeting this challenge is the ability to attain system-level visibility: both during the semiconductor development cycle, and subsequently after embedded systems are deployed in the field.
Discover deep insights into regulatory compliance tests, why it is important, its test challenges, and the solutions to…
Discover deep insights into regulatory compliance tests, why it is important, its test challenges, and the solutions to overcome these obstacles.
This paper shows how manufacturing requirements can be leveraged to perform automated insertion of DRC/LVS-clean vias.
This paper shows how manufacturing requirements can be leveraged to perform automated insertion of DRC/LVS-clean vias.
Building blocks of modern embedded systems, including processors, SoCs, system DRAM, non-volatile memories, sensors, and…
Building blocks of modern embedded systems, including processors, SoCs, system DRAM, non-volatile memories, sensors, and connectivity modules, have varied power requirements. On one extreme, a system power management IC (PMIC) integrates all or almost all of the required power rails. On the other hand, individual power rails are implemented using discrete dc/dc and LDOs.
Among the challenges for design-for-test (DFT) engineers is how to set a target metric for automatic test pattern…
Among the challenges for design-for-test (DFT) engineers is how to set a target metric for automatic test pattern generation (ATPG) and how to choose the best set of patterns. Traditional coverage targets based on the number of faults detected don’t consider the likelihood of one fault occurring compared to another.
Explore how data analyses are being accelerated for autonomous vehicles.
Explore how data analyses are being accelerated for autonomous vehicles.
Learn how the long-established COM Express standard for Computer-on-Modules (COM) has been combined with a new…
Learn how the long-established COM Express standard for Computer-on-Modules (COM) has been combined with a new high-performance computing standard.
This white paper describes a flexible USB4-based IP solution for edge AI accelerators and SoCs. The IP solution can be…
This white paper describes a flexible USB4-based IP solution for edge AI accelerators and SoCs. The IP solution can be used with multiple types of hosts by supporting legacy PCIe 4.0, USB4, USB 3.x, and USB 2.0 connections.
Source control systems have become ubiquitous in the IT world but have not become a major component of operational…
Source control systems have become ubiquitous in the IT world but have not become a major component of operational technology (in particular, PLC programming). There is an increasing, popular movement in the industrial controls world to bring modern source control systems to PLC programming.
Accurately extracting and calculating the common resistance of interconnects within analog IC designs is fundamental for…
Accurately extracting and calculating the common resistance of interconnects within analog IC designs is fundamental for evaluating circuit reliability, particularly for noise and voltage drop analysis and ESD protection verification.
Design companies and foundries are constantly modifying their design implementation flow to deliver the best possible…
Design companies and foundries are constantly modifying their design implementation flow to deliver the best possible solution for their operational needs and the best possible designs for the market.
The monitoring and testing of a DAC signal chain are critical considerations for open-loop applications. Errors in a DAC…
The monitoring and testing of a DAC signal chain are critical considerations for open-loop applications. Errors in a DAC signal chain, including DAC intrinsic errors that vary depending on the system, can significantly disrupt the customer design-in experience.
The integration of multiple digital signal processing (DSP) blocks, wideband digital-to-analog converters (DACs), and…
The integration of multiple digital signal processing (DSP) blocks, wideband digital-to-analog converters (DACs), and wideband analog-to-digital converters (ADCs) within a single monolithic chip are enabling the offloading of FPGA resources.
Condition-based monitoring (CbM) involves monitoring of machines or assets using sensors to measure the current state of health.
Condition-based monitoring (CbM) involves monitoring of machines or assets using sensors to measure the current state of health.
In an era where security is paramount in many systems, it is intrinsic for users to be able to boot and load software…
In an era where security is paramount in many systems, it is intrinsic for users to be able to boot and load software that is guaranteed to be as secure by using a trust-based mechanism.
Timing solutions are critical to today’s electronics. Many engineers rely on the internal real-time clock (RTC)…
Timing solutions are critical to today’s electronics. Many engineers rely on the internal real-time clock (RTC) functionality that comes embedded in microcontroller units (MCUs) and system on chips (SoCs).
This whitepaper presents the new regulations governing smoke alarms, and it describes how ADI's smoke detection module is…
This whitepaper presents the new regulations governing smoke alarms, and it describes how ADI's smoke detection module is designed and tested to meet the new UL-217 8th Ed.
Whether used for a process control installation or an industrial automation system, an I/O module (or a field junction…
Whether used for a process control installation or an industrial automation system, an I/O module (or a field junction box) poses a host of unique challenges in a product's life cycle. Product management, for example, faces key decisions on how many channels and which combinations will be necessary for each product.
Embedded Universal Integrated Circuit Cards(eUICC) have since replaced traditional SIM cards used in the mobile industry.…
Embedded Universal Integrated Circuit Cards(eUICC) have since replaced traditional SIM cards used in the mobile industry. eUICCs can be integrated into anything from mobile devices to car telematics units, machine-to-machine (M2M) devices (e.g., industrial sensors), and consumer devices.
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