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The Most Significant Cyberattack in History Prompts Questions About Supply Chain Security

The Most Significant Cyberattack in History Prompts Questions About Supply Chain Security

The United States is currently dealing with the implications of what experts are calling the most significant cyberattack in its history. What can EEs take from the news?


News Dec 29, 2020 by Jake Hertz
Does Your Oscilloscope Need an Upgrade? New Features Abound from T&M Manufacturers

Does Your Oscilloscope Need an Upgrade? New Features Abound from T&M Manufacturers

You may be happy enough with your trusty old oscilloscope, but there are new upgrades and sleek features offered by manufacturers every day. Here's an overview of some of the most recent additions in o-scope technology.


News Dec 22, 2020 by Jake Hertz
How EE Lab Education is Evolving with At-Home Learning

How EE Lab Education is Evolving with At-Home Learning

Now that universities are adjusting to the realities of remote learning, how are they accommodating the hands-on aspects of EE lab education?


News Nov 24, 2020 by Tyler Charboneau
How the PowerQuad Co-processor Frees Up CPU Cores in the LPC55S69 MCU

How the PowerQuad Co-processor Frees Up CPU Cores in the LPC55S69 MCU

In this article, learn about the PowerQuad co-processor and its role in performing CPU-heavy tasks to allow the Arm Cortex-M33 cores to execute other tasks in the LPC55S69 MCU.


Introduction to JTAG and the Test Access Port (TAP)

Introduction to JTAG and the Test Access Port (TAP)

In this article, we’re going to be talking about JTAG, the ubiquitous hardware tool used for testing, programming, and debugging.


The Effect of Offset Voltage on a Precision Current Source

The Effect of Offset Voltage on a Precision Current Source

In this article, we’ll continue our discussion of an LTspice circuit that helps us to predict how offset-voltage variations will influence circuit performance.


The Challenges of Characterizing Wide Bandgap Semiconductors

The Challenges of Characterizing Wide Bandgap Semiconductors

Wide bandgap semiconductors (WBGs) are seen as the future of power electronics. But the challenges to test and simulate their characteristics are slowing widespread adoption.


News Nov 10, 2020 by Nicholas St. John
Performing Worst-Case Circuit Analysis with LTspice

Performing Worst-Case Circuit Analysis with LTspice

In this article, we'll perform a worst-case analysis in LTspice, using a resistive circuit for a temperature sensor reading as an example.


Simulating Current-Pump Performance with Tolerance and Temperature

Simulating Current-Pump Performance with Tolerance and Temperature

In this article, we use LTspice to analyze the precision of a current-pump circuit when all resistors are non-ideal and temperature is varied across the automotive temperature range.


 LTspice Performance Analysis of a Precision Current Pump

LTspice Performance Analysis of a Precision Current Pump

In this article, we will use simulations to assess important aspects of the performance of an op-amp-based current source.


Finding Statistical Significance from t-Tests Applied to Engineered Systems

Finding Statistical Significance from t-Tests Applied to Engineered Systems

This article discusses important aspects of t-testing with the help of the example experiment presented in the previous article.


Understanding Radiated Electromagnetic Compatibility Tests

Understanding Radiated Electromagnetic Compatibility Tests

This article is the second in a two-part series that reviews the basics of electromagnetic compatibility tests. We'll now turn our attention to radiated EMC tests.


Applying the t-Test to Engineered Systems

Applying the t-Test to Engineered Systems

This article provides an example of how we can use t-testing to determine if an experiment has produced a statistically significant change in system performance.


Understanding Electromagnetic Compatibility Tests: Conducted EMC

Understanding Electromagnetic Compatibility Tests: Conducted EMC

This article is the first in a two-part series that reviews the basics of electromagnetic compatibility tests. First, we'll focus on a main category of EMC tests—conducted EMC—and the relevant test setup.


Understanding the t-Distribution in Tests for Statistical Significance

Understanding the t-Distribution in Tests for Statistical Significance

This article introduces a statistical distribution used in significance testing. We’ll discuss its importance and its relation with the normal distribution.


Statistical Significance in Experimentation and Data Analysis

Statistical Significance in Experimentation and Data Analysis

What exactly do scientists and researchers mean when they state that something is or is not statistically significant? How do we establish statistical significance, and how do we interpret it?


A Brief Review of the Tools and Parameters of EMC Testing

A Brief Review of the Tools and Parameters of EMC Testing

While most electromagnetic compatibility (EMC) tests are conducted in specialized laboratories, electrical engineers can still benefit from knowing the basics of EMC testing.


Finding Statistical Relationships with Correlation Coefficients

Finding Statistical Relationships with Correlation Coefficients

The Pearson and Spearman correlation coefficients are standard techniques for inferring causation by calculating the strength of a linear or monotonic relationship between two variables.


New and Upgraded Oscilloscopes May Be Useful Options in Lab and at Home

New and Upgraded Oscilloscopes May Be Useful Options in Lab and at Home

New oscilloscopes with larger bandwidths, faster sampling rates, and quicker rise times prove that T&M doesn't have to slow down amidst the pandemic.


GaN HEMT Reliability: Why the Industry Can’t Agree on One Testing Standard

GaN HEMT Reliability: Why the Industry Can’t Agree on One Testing Standard

If standardized testing methodology for GaN-based HEMT reliability is far on the horizon, what are manufacturers doing to help deliver quality GaN devices in the meantime?