Learn how SoC integration impacts SMT assembly yield, from fine-pitch BGA challenges and package warpage to reflow profiling and inspection strategies.
Learn how SoC integration impacts SMT assembly yield, from fine-pitch BGA challenges and package warpage to reflow profiling and inspection strategies.
In this project, we'll construct and test a microcontroller-based system that digitally generates analog signals.
In this project, we'll construct and test a microcontroller-based system that digitally generates analog signals.
The new product provides 44 GHz coverage and extends 40 MHz of real-time spectrum analysis across the FPL family.
The new product provides 44 GHz coverage and extends 40 MHz of real-time spectrum analysis across the FPL family.
The new platform adds 120 MHz of gap-free IQ streaming, high-speed data transfer, and AI-assisted waveform identification.
The new platform adds 120 MHz of gap-free IQ streaming, high-speed data transfer, and AI-assisted waveform identification.
Keysight’s new 170/250 GHz frequency extenders and calibration kit enable differential broadband testing for next-gen…
Keysight’s new 170/250 GHz frequency extenders and calibration kit enable differential broadband testing for next-gen semiconductors and AI-era networks.
The paradox of test equipment design is that it must be more advanced than the devices it tests. We spoke with Tektronix…
The paradox of test equipment design is that it must be more advanced than the devices it tests. We spoke with Tektronix in person to gain insights on this unique technical challenge.
New releases from Siglent, Rohde & Schwarz, and Liquid Instruments bring new features to the T&M marketplace.
New releases from Siglent, Rohde & Schwarz, and Liquid Instruments bring new features to the T&M marketplace.
This article explores the effect of signal bandwidth on the linearity of power amplifiers, including the impacts of…
This article explores the effect of signal bandwidth on the linearity of power amplifiers, including the impacts of cascaded RF gain stages.
The device's multipath architecture—a first of its kind—accelerates signal analysis using multiple inputs and…
The device's multipath architecture—a first of its kind—accelerates signal analysis using multiple inputs and cross-correlation.
Red Pitaya is known for its flexible, software-defined instrumentation. Now, its most popular T&M platform is even more…
Red Pitaya is known for its flexible, software-defined instrumentation. Now, its most popular T&M platform is even more performant, connected, and modular.
Learn about the working principles of near-field probes and their applications in troubleshooting EMI issues.
Learn about the working principles of near-field probes and their applications in troubleshooting EMI issues.
During a morning at Electronica's Hall A3, we visited numerous booths to learn about new instruments for an engineer's…
During a morning at Electronica's Hall A3, we visited numerous booths to learn about new instruments for an engineer's toolbox. Here are three highlights.
Check out the technologies and products these leading companies plan to showcase at next week's Embedded World trade show…
Check out the technologies and products these leading companies plan to showcase at next week's Embedded World trade show in Nuremberg, Germany.
In this article, we conclude our discussion of VNAs by walking through the steps of a SOLT calibration and examining the…
In this article, we conclude our discussion of VNAs by walking through the steps of a SOLT calibration and examining the potential non-idealities of its reference standards.
The 12-term error model is a simple, effective way of modeling systematic errors in vector network analyzer (VNA)…
The 12-term error model is a simple, effective way of modeling systematic errors in vector network analyzer (VNA) measurements. Learn about this model and an associated error correction technique in this article.
In this article, we compare the scope of factory and user calibration for vector network analyzers (VNAs). We then learn…
In this article, we compare the scope of factory and user calibration for vector network analyzers (VNAs). We then learn about the types of errors that calibration techniques can't correct.
Learn the basics of how vector network analyzer (VNA) calibration techniques correct measurement errors.
Learn the basics of how vector network analyzer (VNA) calibration techniques correct measurement errors.
This article explains how to estimate the dynamic range a vector network analyzer (VNA) needs for a given measurement,…
This article explains how to estimate the dynamic range a vector network analyzer (VNA) needs for a given measurement, then discusses four techniques for boosting the dynamic range to the required level.
In this article, we investigate two metrics used to characterize the performance of RF test and measurement systems.
In this article, we investigate two metrics used to characterize the performance of RF test and measurement systems.
The new lineup of products caters to engineers working on wireless communications and high-speed digital systems.
The new lineup of products caters to engineers working on wireless communications and high-speed digital systems.
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