All About Circuits

Latest Test & Measurement Articles and Videos

Categories

Demystifying the Skin Effect: Insights into AC Current Distribution

Demystifying the Skin Effect: Insights into AC Current Distribution

This article will demonstrate that the AC current density decreases exponentially into a conductor. It will also explain why we can assume that the total current has a uniform distribution from the surface down to one skin depth of the conductor.


Three T&M Tools Speed Verification for Data-heavy Applications

Three T&M Tools Speed Verification for Data-heavy Applications

Some of the biggest names in testing equipment have released new tools to accelerate verification for communication chips, PCIe cables, wide bandgap devices, and more.


News Jul 22, 2023 by Kristijan Nelkovski
At DAC 2023, EDA Tools Roll Aimed at Next-gen IC Design and Verification

At DAC 2023, EDA Tools Roll Aimed at Next-gen IC Design and Verification

A slew of new electronic design automation (EDA) tools and resources for IC design and verification were debuted at last week’s DAC 2023 event. Here’s a sampling.


News Jul 17, 2023 by Darshil Patel
Keysight’s New SMU Promises to Accelerate Semiconductor Characterization

Keysight’s New SMU Promises to Accelerate Semiconductor Characterization

Digital designers can substitute complex multichannel test setups for a single-package, high-density test solution.


News Jul 17, 2023 by Aaron Carman
YAGEO RP Automotive Grade Thin Film Chip Resistor | New Product Brief

YAGEO RP Automotive Grade Thin Film Chip Resistor | New Product Brief

YAGEO RP Automotive Grade Thin Film Chip Resistors are designed to deliver high precision and stability in a compact surface mount package. Watch and learn all about their features, specs, applications, and more!


Gain Definitions for the Y-Factor Method of NF Measurements: Available Gain or Insertion Gain?

Gain Definitions for the Y-Factor Method of NF Measurements: Available Gain or Insertion Gain?

The Y-factor method is a widely used technique for measuring the gain and noise figure (NF) of RF components. This article will help you understand the differences between the insertion gain and the available gain, while avoiding potentially significant errors when measuring the noise figure.


AMD Claims Planet’s Largest FPGA-based SoC for Emulation and Prototyping

AMD Claims Planet’s Largest FPGA-based SoC for Emulation and Prototyping

The company positions the new chiplet-based SoC as well suited for todays’ ever more complex chip designs.


News Jun 27, 2023 by Jake Hertz
An RMS Detector for a Wideband Voltmeter—Design and Operation

An RMS Detector for a Wideband Voltmeter—Design and Operation

This project demonstrates the design and operation of a root-mean-squared (RMS) detector for inclusion in a wideband voltmeter. The RMS detector is useful for measuring certain signal types, including noise, since it provides an indication of the energy in a signal.


Projects Jun 25, 2023 by John Woodgate
Pickering Teams Up With Menlo Micro for MEMS-Based RF Multiplexers

Pickering Teams Up With Menlo Micro for MEMS-Based RF Multiplexers

The collaboration will deliver test systems with 300x longer operational life and 60x test system throughput, according to the companies.


News Jun 23, 2023 by Jake Hertz
Exploring Output Ripple in a Negative Voltage Charge Pump Using LTspice

Exploring Output Ripple in a Negative Voltage Charge Pump Using LTspice

In this article, we’ll use LTspice simulations to more thoroughly understand output-voltage ripple and consider techniques for mitigating it within a charge pump circuit.


New LiDAR Improves Testing, Satellite Vision, and Autonomous Trucking

New LiDAR Improves Testing, Satellite Vision, and Autonomous Trucking

Innovative LiDAR solutions with enhanced accuracy and extended range may transform the testing, mapping, and trucking landscape—and beyond.


News Jun 17, 2023 by Darshil Patel
Digilent Completes Tiny Test Equipment Trilogy With Analog Discovery 3

Digilent Completes Tiny Test Equipment Trilogy With Analog Discovery 3

Designers have an all-new tool for portable testing that only requires a USB cable and a computer.


News Jun 13, 2023 by Aaron Carman
Explore the Y Factor Method for Noise Figure Measurement

Explore the Y Factor Method for Noise Figure Measurement

Learn about measuring the noise figure (NF) using the Y factor method. We'll dive into using this to find the noise factor, how to calibrate for noise temperature, and much more.


RadarConf 2023 Panel—Innovating Radar in the Face of Physical Limits

RadarConf 2023 Panel—Innovating Radar in the Face of Physical Limits

In the face of fundamental limits, radar industry leaders are poised to tackle the coming challenges in radar in their own unique ways.


News Jun 06, 2023 by Aaron Carman
Improving ADC SFDR Using Dithering for Communication System Applications

Improving ADC SFDR Using Dithering for Communication System Applications

Learn more about dithering, namely improving the spurious-free dynamic range (SFDR) of an analog-to-digital converter (ADC) that exhibits differential nonlinearity (DNL) errors.


Exploring Single Stub Impedance Matching Through Smith Chart Examples

Exploring Single Stub Impedance Matching Through Smith Chart Examples

Learn about impedance matching using a single stub, transmission lines, and immittance Smith chart examples.


Designing a Wideband Analog Voltage and Current Meter

Designing a Wideband Analog Voltage and Current Meter

Design a wideband analog multimeter to measure AC voltages and currents from 20 Hz to 1 MHz with a selectable sensitivity from 1 mV to 100 V, while the ammeter has a selectable current sensitivity of 10 mA to 10 A.


Projects May 03, 2023 by John Woodgate
Understanding Limitations to Increasing SFDR in High-speed ADCs

Understanding Limitations to Increasing SFDR in High-speed ADCs

Learn about two nonlinearity sources, spurious-free dynamic range (SFDR), and SNR (signal-to-noise ratio) in analog-to-digital converters (ADCs).


Introduction to Impedance Matching Using Transmission Line Elements

Introduction to Impedance Matching Using Transmission Line Elements

Learn about an impedance-matching technique using transmission line elements.


The State of SiC: A Roundup of SiC Supply Cuts, Booms, and More

The State of SiC: A Roundup of SiC Supply Cuts, Booms, and More

While some companies are scaling back SiC procurement in response to supply chain constraints, others are ramping up manufacturing and even developing SiC-focused simulation software.


News Apr 10, 2023 by Jake Hertz