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How SoC Integration Impacts SMT Assembly Yield

How SoC Integration Impacts SMT Assembly Yield

Learn how SoC integration impacts SMT assembly yield, from fine-pitch BGA challenges and package warpage to reflow profiling and inspection strategies.


Building a DIY Probe Station

Building a DIY Probe Station

This how-to guide outlines everything you'll need to build a basic probe station on a budget.


Why 90% of Component Compliance Issues Are Preventable (And How To Stop Them)

Why 90% of Component Compliance Issues Are Preventable (And How To Stop Them)

In today's rapidly evolving aerospace and defense landscape, component engineers face an unprecedented challenge: ensuring every part they specify meets stringent compliance requirements while maintaining mission readiness and program viability.


A New Ratiometric Data Acquisition Circuit for Unequal Supply and Reference Voltages

A New Ratiometric Data Acquisition Circuit for Unequal Supply and Reference Voltages

This article introduces a new ratiometric data-acquisition system design for use with remote sensors. As we’ll see, it reduces error by employing matched resistor divider networks.


How to Hurdle Overswing and Noise In Low Power Designs

How to Hurdle Overswing and Noise In Low Power Designs

Overswing can occur when Zener diodes are pushed to their limits. Learn about why this happens and the problems it causes—and how to overcome the issue.


A Guide to Effective Probe Selection for Low Noise Power Integrity Measurements

A Guide to Effective Probe Selection for Low Noise Power Integrity Measurements

To understand how to achieve the most accurate low-noise measurements, we will compare the noise performance of multiple probe solutions using a Rohde & Schwarz (R&S) MXO 5 series oscilloscope.


Understanding the Benefits of Power-Focused Regression Testing

Understanding the Benefits of Power-Focused Regression Testing

By including power consumption measurement in your regression testing, you can ensure the reliability and efficiency of your IoT device design throughout its lifecycle.


Understanding How CXL 3.0 Links the Data Center Fabric

Understanding How CXL 3.0 Links the Data Center Fabric

The CXL data protocol is essential for meeting the interconnect needs of today’s data centers. Learn the key elements and benefits of this protocol, along with what’s new in CXL version 3.0.


Debugging Common I2C and SPI Problems with Advanced Oscilloscopes

Debugging Common I2C and SPI Problems with Advanced Oscilloscopes

There are a host of tricky challenges that emerge when debugging complicated I2C and SPI errors. Learn how leveraging key features of today’s advanced oscilloscopes can smooth the way.


Interference Hunting in 5G Networks

Interference Hunting in 5G Networks

Interference hunting is a complex task at the 5G level—mmWave signals behave differently than those at sub-6 GHz. It's less about noise and more about blockage.


The Need for High-Accuracy Ultra-Low Pressure Sensors

The Need for High-Accuracy Ultra-Low Pressure Sensors

Learn about the benefits of board-mounted pressure sensors and the considerations when selecting them.


How the PowerQuad Co-processor Frees Up CPU Cores in the LPC55S69 MCU

How the PowerQuad Co-processor Frees Up CPU Cores in the LPC55S69 MCU

In this article, learn about the PowerQuad co-processor and its role in performing CPU-heavy tasks to allow the Arm Cortex-M33 cores to execute other tasks in the LPC55S69 MCU.


How to Obtain the Temperature Value from a Thermistor Measurement

How to Obtain the Temperature Value from a Thermistor Measurement

This article explains how to use an NTC or a PTC thermistor with an ADC, along with the various process techniques to convert ADC measured results into a usable temperature value.


Advances in Temperature Measurement for Automotive Infotainment Systems

Advances in Temperature Measurement for Automotive Infotainment Systems

This article explores temperature monitoring in complex vehicle infotainment systems, focusing on design considerations around temperature accuracy and sensor placement in the car. 


Resolving the Signal Part 12: Reducing the Effects of Power-Supply Noise using Delta-Sigma ADCs

Resolving the Signal Part 12: Reducing the Effects of Power-Supply Noise using Delta-Sigma ADCs

In part 12 of Resolving the Signal, we look at a power-supply noise design example to discuss which supplies are most critical when trying to increase a system's PSR. From that example, we offer best practices to maintain low power-supply noise and debugging tips for a system's overall noise performance.


Resolving the Signal Part 11: Understanding How Power-Supply Noise Affects Delta-Sigma ADCs

Resolving the Signal Part 11: Understanding How Power-Supply Noise Affects Delta-Sigma ADCs

Part 11 of the Resolving the Signal series explores how power supplies contribute to unwanted noise, how to measure and quantify that noise, and how noise ends up impacting system performance.


Resolving the Signal Part 8: How Voltage Reference Noise Affects Delta Sigma ADCs

Resolving the Signal Part 8: How Voltage Reference Noise Affects Delta Sigma ADCs

Part 8 of the Resolving the Signal series dives further into how different noise sources impact precision delta-sigma ADCs by focusing on reference noise and ADC noise, and how gain affects reference noise.


How To Minimize Sensing Measurement Error

How To Minimize Sensing Measurement Error

In this how-to video, we’ll discuss the importance of op-amp noise performance in sensing applications.


Resolving the Signal: Introduction to Noise in Delta-Sigma ADCs Part 2

Resolving the Signal: Introduction to Noise in Delta-Sigma ADCs Part 2

In part 2 of this series, I'll continue the fundamental ADC noise discussion by covering how to measure ADC noise, noise specifications in ADC data sheets, and absolute versus relative noise parameters.


Power Supply Management of GaN MMIC Power Amplifiers for Pulsed Radar

Power Supply Management of GaN MMIC Power Amplifiers for Pulsed Radar

Systems that incorporate highly integrated and highly sophisticated, high power radio frequency (RF) GaN power amplifiers (PAs), such as pulsed radar applications, are a constant challenge for today’s digital control and management systems to keep up with these ever-increasing levels of sophistication.