Angstrom-scale ICs will require innovation across the entire semiconductor ecosystem: This will include advances in both the hardware (transistors, power distribution, and connection of multi-die systems) and tools (EDA tools with AI/ML and silicon life-cycle management).
August 31, 2023 by Rob Aitken, Synopsys
There are a host of tricky challenges that emerge when debugging complicated I2C and SPI errors. Learn how leveraging key features of today’s advanced oscilloscopes can smooth the way.
March 02, 2023 by Daniel Monforte, RIGOL Technologies
This article explores the IEC 60730 Class B standard for functional safety to address both mechanical and electrical design in appliances. Learn what the standard entails and controllers to help meet these standards.
December 01, 2020 by Chad Solomon, Microchip Technology