Latest Technical Articles

In this article, we will use simulations to assess important aspects of the performance of an op-amp-based current source.

In this article, we will use simulations to assess important aspects of the performance of an op-amp-based current source.

In this article, we will review the different types of noise that are present in a circuit. We will also discuss how to…

In this article, we will review the different types of noise that are present in a circuit. We will also discuss how to perform an accurate simulation of an EMC filter with LTspice.

This article discusses a voltage-controlled current-source circuit that requires only two op-amps and a handful of resistors.

This article discusses a voltage-controlled current-source circuit that requires only two op-amps and a handful of resistors.

This article discusses important aspects of t-testing with the help of the example experiment presented in the previous article.

This article discusses important aspects of t-testing with the help of the example experiment presented in the previous article.

This article is the second in a two-part series that reviews the basics of electromagnetic compatibility tests. We'll now…

This article is the second in a two-part series that reviews the basics of electromagnetic compatibility tests. We'll now turn our attention to radiated EMC tests.

This article provides an example of how we can use t-testing to determine if an experiment has produced a statistically…

This article provides an example of how we can use t-testing to determine if an experiment has produced a statistically significant change in system performance.

This article explains how t-values are calculated and used to decide whether experimental data indicate a relationship…

This article explains how t-values are calculated and used to decide whether experimental data indicate a relationship between variables.

This article is the first in a two-part series that reviews the basics of electromagnetic compatibility tests. First,…

This article is the first in a two-part series that reviews the basics of electromagnetic compatibility tests. First, we'll focus on a main category of EMC tests—conducted EMC—and the relevant test setup.

Learn about various non-idealities of MOS transistors and the effects they have on VLSI system reliability.

Learn about various non-idealities of MOS transistors and the effects they have on VLSI system reliability.

This article introduces a statistical distribution used in significance testing. We’ll discuss its importance and its…

This article introduces a statistical distribution used in significance testing. We’ll discuss its importance and its relation with the normal distribution.

What exactly do scientists and researchers mean when they state that something is or is not statistically significant?…

What exactly do scientists and researchers mean when they state that something is or is not statistically significant? How do we establish statistical significance, and how do we interpret it?

While most electromagnetic compatibility (EMC) tests are conducted in specialized laboratories, electrical engineers can…

While most electromagnetic compatibility (EMC) tests are conducted in specialized laboratories, electrical engineers can still benefit from knowing the basics of EMC testing.

The Pearson and Spearman correlation coefficients are standard techniques for inferring causation by calculating the…

The Pearson and Spearman correlation coefficients are standard techniques for inferring causation by calculating the strength of a linear or monotonic relationship between two variables.

This article discusses VLSI (very-large-scale integration) circuits and the sources of non-idealities that affect MOS transistors.

This article discusses VLSI (very-large-scale integration) circuits and the sources of non-idealities that affect MOS transistors.

Statistical techniques can help us to analyze the distribution of light and dark tones in an image.

Statistical techniques can help us to analyze the distribution of light and dark tones in an image.

This Frequent Engineering Question gives a quick overview of a mathematical function that appears frequently in digital…

This Frequent Engineering Question gives a quick overview of a mathematical function that appears frequently in digital signal processing.

This article explains a statistical measure that helps us to draw conclusions about how one variable affects another.

This article explains a statistical measure that helps us to draw conclusions about how one variable affects another.

This article introduces important subcategories of inferential statistical tests and discusses descriptive statistical…

This article introduces important subcategories of inferential statistical tests and discusses descriptive statistical measures related to the normal distribution.

How can you build a fast non-volatile memory from a conventional SRAM? It turns out, you only need a back-up battery and…

How can you build a fast non-volatile memory from a conventional SRAM? It turns out, you only need a back-up battery and some control circuitry.